Keysight Technologies Inc. announced its first PXI Express source/measurement unit, the M9111A, purpose-built for design validation and production test of next-generation power amplifiers and front-end modules supporting cellular and wireless connectivity formats.
Anritsu Co. (Booth #949) will showcase its high-frequency test solutions that address the complex challenges associated with emerging microwave and millimeter wave (mmWave) designs, such as automotive radar and 5G, at IMS2016.
The R&S TS8980 RF conformance test system from Rohde & Schwarz is claimed to have achieved the world's first validation for both LTE-Advanced uplink carrier aggregation and LTE-Advanced Pro uplink 64QAM.
Keysight Technologies Inc. announced it will demonstrate the latest design, simulation and test solutions for wireless communications and aerospace & defense at the IEEE MTT-S International Microwave Symposium (IMS2016), Booth 1239, San Francisco, Calif., May 24-26.
Global connectivity leader HUBER+SUHNER continues to establish its expertise at the International Microwave Symposium in San Francisco, 22-27 May 2016, exhibiting a range of new products including SUCOFLEX 500V VNA test assemblies, Microbend L, SUCOFLEX 126 and its RF/GPS/LAN-over-Fiber Series, which combine radio frequency and fiber optics in one system.
Vaunix Technology Corp., a manufacturer of USB controlled and powered test equipment, will be debuting two new test application solutions at the 2016 International Microwave Symposium (IMS) in San Francisco, Calif., the LDA-203 and the LMS-802DX.
Anritsu Co. continues to address the test needs of signal integrity (SI) engineers with the introduction of options for its VectorStar® and ShockLine™ vector network analyzers (VNAs). The VectorStar Eye Diagram and ShockLine Advanced Time Domain (ATD) options are part of the expanding SI capabilities offered by Anritsu and provide SI engineers with improved tools to conduct channel diagnostics and model validation of high-speed digital circuit designs.