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Test and Measurement Channel

Optimal+ announces big data analytics support for NI semiconductor test system

Optimal+, a global big data analytics provider for the semiconductor industry, announced that it has collaborated with NI, a leading provider of platform-based test systems that enable engineers and scientists to solve the world’s greatest engineering challenges, so that the entire suite of solutions from Optimal+ will be supported by NI’s Semiconductor Test System (STS) via the Optimal+ Proxy starting in Q1 2016.


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Keysight's new X-Series signal analyzers provide significantly enhanced capabilities

Keysight Technologies, Inc. announced new X-Series signal analyzers that provide significantly enhanced capabilities for developers creating next-generation devices. Most notable is a multi-touch user interface (UI) that streamlines measurement setup and creates a solid foundation for new solutions. Performance improvements and feature enhancements address emerging needs in aerospace, defense and wireless communications.


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Keysight’s new user experience builds on tradition of unsurpassed quality, craftsmanship

Keysight Technologies, Inc. announced the new design of Keysight products built on a platform of exceptional user experience, with advances in multi-touch user interface and an environmentally responsible build and re-use model. The contemporary, new look complements the company’s uncompromised history of quality and craftsmanship.


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Tektronix unveils new logo, brand strategy

Tektronix, Inc., a leading worldwide provider of measurement solutions, launched a new logo and brand strategy, marking the most significant change in its visual identity in 24 years. Founded in 1946, Tektronix is one of the most iconic companies in the electronics industry. On the eve of the company’s 70th anniversary, the refreshed logo pays homage to this herita


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NI Automated Test Outlook reinforces need for smarter test systems

NI announced the release of its Automated Test Outlook 2016. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.


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