Test and Measurement Channel

Agilent Technologies announces IEEE 802.11n MIMO modulation analysis capability for emerging communications applications

Agilent Technologies Inc. (NYSE: A) today announced the availability of an IEEE 802.11n MIMO modulation analysis capability for its 89600 Series vector signal analysis software. Featuring a broad set of measurements, this capability is the ideal R&D tool for developers of Multiple-Input, Multiple-Output (MIMO) based IEEE 802.11n components, subsystems and systems, using general-purpose measurement tools.
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Agilent Technologies uses interactive online demonstration to highlight web capabilities of LXI instruments

Agilent Technologies Inc. (NYSE: A) today announced online access to three operational instruments, compatible with the LAN eXtensions for Instrumentation (LXI) standard, through the instruments' built-in Web pages. From their desktops, visitors to the "LXI Live" Web site can interact with each product, viewing actual Web pages that display information such as product description, functionality and configuration. This type of remote, Web-based access to a measurement system illustrates the distributed, global test capabilities enabled by LXI-compliant products.
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Agilent Technologies announces development of MB-OFDM modulation analysis capability for WiMedia-based UWB applications

Agilent Technologies Inc. (NYSE: A) today announced the development of a full-featured, MB-OFDM (multi-band orthogonal frequency division multiplexing) ultra-wideband modulation analysis capability for its 89600 Series vector signal analysis software. Featuring a comprehensive set of measurements and excellent error vector magnitude specifications, R&D developers can troubleshoot MB-OFDM ultra-wideband signals at any stage of the design process and more quickly identify the root cause of any potential problem in wireless USB and ultra-wideband (UWB) components, subsystems and systems.
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Cavity Techniques for Substrate Properties at Microwave/Millimeter-wave Bands

For quality control in the design of microwave and millimeter-wave circuitry and devices, it is important to have a good measure of the dielectric properties of the materials employed. The standards and methods that are often employed for this purpose ...
The setups presented are essentially of two types - thin dielectric sheet testers and z-axis testers. These are the tools that are employed to independently measure the components of the substrate dielectric constant. It is supposed that suitable propagation models may use this information to better predict propagation mode...
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Recent Advances in EDA Software Solutions for Improved RFIC Design Flows

Today's wireless world requires unrelenting technological innovation. From cell phones that take and send photos to homeland security, the demands on wireless designers for increasing complexity at lower prices and faster time-to-market are immense. Advances in electronic design automation (EDA) over the last decade have made possible dramatic improvements...
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