Test and Measurement Channel

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Scanning Atoms with the Tip of a Needle

Digitizer from Spectrum helps researchers to improve the atomic force microscope

At the University of Newcastle, Dr. Michael Ruppert and his team are improving the key elements of AFM systems to simplify the operation as well as to enhance the overall performance, using a model DN2.593-08 digitizerNETBOX from Spectrum Instrumentation.


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Keysight Expands Source/Measure Units for High Accuracy, High-Resolution and Measurement Flexibility Test Apps

Three Source Measure Units for Test Applications

Keysight Technologies, Inc. announced three new source measure units (SMUs) for test applications that require high accuracy, high-resolution and measurement flexibility, including current versus voltage (I-V) characterizing and testing semiconductors, as well as other non-linear devices and materials.


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