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Industry News

A Vector Signal Generator for Production Applications

Recognition that the key requirements of test equipment used in an automated production environment are high throughput and reproducibility has led to the development of the R&S SMATE 200A vector signal generator. Designed as an optimum solution, this instrument features short setting times for frequency and level changes plus...
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A Common Test Software Platform for High Performance Automatic Test Systems

With 30 years of experience as a supplier of space-qualified components and subsystems, COM DEV is well familiar with the challenges faced by the space industry in testing low volume, high performance, high reliability components. Thorough testing under difficult test conditions is required at each step of the production...
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Satellite In-orbit Group Delay Measurement Using a Microwave System Analyzer

Typical established satellite transponders are often configured with channel bandwidths of between 26 and 72 MHz depending on the satellite system, although bandwidths between 5 and 120 MHz are not uncommon. This bandwidth was considered to be more than acceptable when the satellites were launched, but with the increasing...
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A High Power, High Speed 100 MHz Programmable Tuner

In 2003 Focus Microwaves introduced its iTuner computer-controlled electro-mechanical microwave tuner product line. At the time it featured a frequency range of 0.2 to 18 GHz, and was completely self-contained and fully calibrated as a result of the powerful internally housed micro-controller. This innovative new device revolutionized production testing...
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Nonlinear Diode Models for Enhanced Simulation Accuracy

A library of robust models featuring substrate scalability and temperature dependence is now available for surface-mount diodes. The Modelithics Nonlinear Diode (NLD™) Library contains a compilation of measurement validated nonlinear diode models developed from I-V, C-V, small- and large-signal S-parameter characterization data. Over-temperature testing, combined with Modelithics’ patent-pending substrate-scalability...
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Planar Electromagnetic Software – Personal Reflections

I first realized there was a major problem in 1982 when I moved from GE Valley Forge Space Division to GE Electronics Laboratory (E-Lab) in Syracuse to design some of the first GaAs monolithic microwave integrated circuits (MMIC). I took over the design of a C-band low noise amplifier...
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A CAD Algorithm for RF/Microwave Interconnect Modeling

This article presents a numerical technique (CAD) to model and analyse interconnects encountered in the design of high speed/high frequency analog RF/microwave circuits with mixed, lumped and distributed elements to be implemented on-chip. In this meth...
Because of the rapid growth in density and complexity of modern integrated circuit interconnects, modeling has been a requirement in circuit design and simulations. On-chip interconnects have achieved a dominant role, especially in determining the performance of RF and monolitic microwave integrated circuits (MMIC). In the last two decades,...
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A CAD-oriented Approach to Design of Load Impedance and Input Matching in Active Transmitting Antennas

This article discusses a general computer-aided design (CAD) approach to obtain the optimal fundamental load impedance and design the input matching circuits for an active integrated antenna of the transmitting type. A case study of a design for 1.6 GH...
An active integrated antenna (AIA) may be defined as a system in which an active device, usually a transistor, is closely integrated within an antenna, using a minimum of intervening circuitry. In recent years, AIAs have been considered a useful approach for improving performance and reducing size in front-end...
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De-embedding Using a Vector Network Analyzer Including Calibration and Measurement Techniques

The inclusion of adapters and test fixtures in a measurement setup is often necessary even if the consequence is less accuracy. De-embedding the device characteristics has been traditionally the most effective method of minimizing the negative effects. However, the process of de-embedding has been a laborious, expensive procedure restricted...
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The Importance of Sweep Rate in DC IV Measurements

The importance of taking due care in setting up IV measurement sweep rate is explored for the case of a GaAs MESFET and a silicon MOSFET. A numerical metric, called the normalized difference unit (NDU), is shown to be useful in determining appropriate ...
The DC IV characterization of a device is important in predicting RF operation. DC IV results predict the quiescent bias and low frequency IV characteristics for a device, while in some cases they can be corrected to represent RF characteristics at a given quiescent bias point. 1,2 In addition,...
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