Microwave Journal

75th ARFTG Conference Highlights

April 1, 2010

Since its inception in 1972, the Automatic RF Techniques Group (ARFTG) has worked to create a constructive forum and voice for the community of RF and microwave test engineers—both test instrumentation end users and vendors alike. Through its various conferences, workshops and training courses, the organization endeavors to keep its 600+ members worldwide up to date on the latest developments in test and measurement techniques.


Nowhere is this educational mission more evident than at the upcoming 75th ARFTG Microwave Measurement Conference, which is scheduled to take place in Anaheim, CA, on May 28, 2010. Here, colleagues, experts and vendors in the RF and microwave test and measurement community will have the opportunity to meet face-to-face to discuss ongoing developments and the similar challenges they each face.

This year, the conference will explore a critical theme—measurement of modulated signals for communication. Kicking off the discussion will be an invited talk on modern cellular wireless signals from Dr. McCune, RF Communication Consulting. The rest of the event will highlight an array of papers covering everything from vector signal measurements and complex waveform analysis to nonlinear measurement techniques in the time and envelope domains. The application of digital signal processing to communications signal measurements is another topic that will be discussed.

The 75th ARFTG conference is being held in conjunction with the 2010 IEEE MTT-S International Microwave Symposium. For additional information on this event, please visit: www.arftg.org or www.ims2010.org.