Microwave Journal

71st ARFTG Microwave Measurement Conference

May 28, 2008

The 71st Automatic RF Techniques Group (ARFTG) Microwave Measurement Conference will be held at the Omni Hotel at CNN Center in Atlanta, GA, on Friday 20th June 2008. This year’s conference theme -“Network Analysis: 50 Years On” - provides an opportunity to celebrate the role of the network analyzer in our industry during the past, present and into the future. Doug Rytting will set the scene with a keynote address and the regular papers will also be focusing on network analysis and related topics.

The conference will be preceded on Thursday afternoon by the Nonlinear Vector Network Analyzer (NVNA) Users’ Forum - an informal discussion group devoted to sharing information and issues related to instrumentation utilized in vector large-signal analysis of microwave circuits and systems that contain nonlinear elements. Also be sure to check out the joint ARFTG/IMS sponsored workshops: “High Speed Signal Integrity Workshop – Emphasis on Jitter” and “Applications and Misapplications of Measurement Uncertainty” in the IMS program. These will be taking place on Monday 16th June.


An important part of all ARFTG conferences is the opportunity to interact with colleagues, experts and vendors in the RF and microwave test and measurement community. Starting with the continental breakfast in the exhibition area, continuing through the two exhibition/interactive forum sessions and the luncheon, there will be ample opportunity for discussion with others facing similar challenges. So, come and join us; you’ll find that the atmosphere is informal, open and friendly.

Visit www.arftg.org or www.ims2008.org for full details of all the events.

Nick M Ridler, Conference Chair
Roger D Pollard, Technical Program Chair

Registration Details

71st ARFTG Conference registration includes conference sessions, abstract book, IMS/ARFTG CD-ROM, breakfast, lunch, exhibition and ARFTG membership.

IEEE or ARFTG Members: $210
Nonmembers: $330
Students, Retirees: $135

To register, visit: www.ims2008.org.