Microwave Journal

IEEE International Symposium on EMC Sets Records

February 23, 2007

The 2007 Institute of Electrical and Electronic Engineers (IEEE) International Symposium on Electromagnetic Compatibility (EMC) set an all time record in the number of papers received for the Symposium’s technical program. The 10 Technical Committees (TC) of the IEEE EMC Society reviewed over 300 papers. TC-2, which addresses “EMC Measurement,” received the largest number of papers, followed by TC-4 on “EMI Control” and TC-9 on “Computational EMC.” The best papers will be presented during the Symposium, which takes place at the Hawaii Convention Center in Honolulu, HI, over July 8-13, 2007.

Todd Hubing of Clemson University and Don Heirman of Don Heirman Consultants are the co-chairs of the Symposium’s Technical Program. Professor Hubing noted, “We were especially gratified to not only receive a high number of papers, but also papers from authors around the world. Approximately 30 percent of the paper authors are from Asia, 31 percent are from the US and 39 percent are from Europe.

This represents a truly international program of papers for the symposium this year.” Added Heirman, “We were also pleased to see excellent special sessions and workshops submitted on such important topics as automotive EMC, signal integrity, EMC and wireless devices, and managing regulatory access to Asia Pacific Markets, to name just a few.”

The year 2007 marks the 50th Anniversary of the EMC Society. Janet O’Neil of ETS-Lindgren, chair of the Symposium Steering Committee, announced many special activities are planned to commemorate this milestone. “The Hawaii Convention Center was selected as the venue for this special symposium as its geographic location will appeal to EMC engineers in Asia, which is the fastest growing region for IEEE EMC Society membership.

In addition, we’re celebrating the 50th anniversary in the 50th state, a unique tie-in that we’ll see just once in our lifetimes. We welcome those interested in EMC to join us in Hawaii to hear excellent technical papers, view a comprehensive technical exhibition and celebrate our 50th anniversary with us.”