Microwave Journal
www.microwavejournal.com/articles/27948-hardware-and-measurement-abstraction-layers
National Instruments

Hardware and Measurement Abstraction Layers

March 3, 2017

Hardware abstraction layers (HALs) and measurement abstraction layers (MALs) are some of the most effective design patterns to make test software as adaptable as the hardware. Rather than employing device-specific code modules in a test sequence, abstraction layers give you the ability to decouple measurement types and instrument-specific drivers from the test sequence. Learn how to drastically reduce development time by giving hardware and software engineers the ability to work in parallel.

Download Now