Agilent ships newest EMPro software release for analyzing 3-D electromagnetic effects
Agilent Technologies Inc. announced shipment of EMPro 2012, its 3-D electromagnetic simulation software.
EMPro 2012 allows designers to more easily create 3-D models and analyze the electrical performance of packages, connectors, antennas, and other RF and high-speed components. It delivers a number of critical features for new and existing EMPro users, including:
- Enhanced integration between EMPro and Advanced Design System, enabling users to save EMPro projects as ADS libraries; availability of 3-D models in ADS as schematic and layout views; and availability of parameters created in EMPro in ADS for EM sweep/optimization. Additionally, changes made in EMPro now dynamically update in ADS.
- A low-frequency analysis algorithm that enables stable, accurate results down to very low frequencies (below100 MHz, including at DC). The algorithm also provides accurate DC results for use in higher-frequency circuit simulations.
- Faster Finite Element Method (FEM) simulations (1.4X compared with EMPro 2011) stemming from technology advancements that increase the robustness and speed (two to three times faster) of the FEM mesher.
Currently supported Agilent customers interested in the EMPro 2012 technologies, applications and capabilities should contact their local applications engineer or field sales person for more information.
EMPro 2012 is now available for download at www.agilent.com/find/eesof-empro-downloads-and-trials. Application examples covering a wide range of topics, including packaging, antennas, RF PCBs, RF modules, connectors and radar applications can be downloaded at edocs.soco.agilent.com/display/eesofapps/EM+Applications.
More information on EMPro 2012 is available at www.agilent.com/find/eesof-empro. An image of the software release is available at www.agilent.com/find/EMPro2012_images. Visit the Agilent YouTube network at www.youtube.com/AgilentTM to see latest products and applications videos in electronic design and measurement.