Agilent Offers New Application Note on LTE-Advanced Physical Layer Design and Test
October 31, 2011
What: The Agilent Power of X application notes provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments. The new “Solutions for LTE-Advanced Physical Layer Design and Test” 5990-9138EN, offers insights into how to use signal generation and analysis to overcome challenges associated with carrier aggregation.
When: Available today
Where: To request copies of the free application notes go to www.agilent.com/find/powerofx Registration is required
Additional Information: www.agilent.com/find/powerofx
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