Microwave Journal

Agilent Technologies Wins Prestigious EDN Award for Medalist Bead Probe Technology

April 18, 2007
SANTA CLARA, Calif., April 18, 2007 -- Agilent Technologies Inc. (NYSE: A) today announced that its revolutionary Agilent Medalist Bead Probe Technology has won the 17th EDN Innovator/Innovation Awards in the Test and Measurement category. In addition, Kenneth Parker, co-inventor of the Medalist Bead Probe Technology, was named a finalist for the 17th EDN Innovator of the Year award. Parker is senior scientist of in-circuit test (ICT) technology with Agilent's Measurement Systems Division. EDN serves the information needs of design engineers and engineering managers worldwide. The awards honor the people, products and technologies that have shaped the electronics industry during the past year. EDN selected the winners and finalists from hundreds of nominees in 17 categories. "It's become increasingly clear that digital media devices for consumers are driving the tech industry," said Maury Wright, editorial director for EDN Worldwide. "The Innovation Award winners in our 17th annual program reflect that trend with products that enable an incredibly compelling consumer experience. I congratulate all of the winners on the great work they did in 2006." "It is an honor for Agilent to win this award," said Amir Aghdaei, vice president and general manager of Agilent's Measurement Systems Division. "Agilent has been leading innovations in the in-circuit test arena for more than two decades. We continue to strive for breakthroughs to enable high-volume electronic manufacturers solve their new test and inspection challenges." Agilent Medalist Bead Probe Technology is a proven methodology for placing solder beads, or "bead probes," directly onto printed circuit board (PCB) signal traces. This advancement addresses the pressing need for more test accessibility on printed circuit boards at in-circuit test, especially for dense or high-speed PCB designs. Bead probes reduce manufacturing costs by eliminating the need for costly, time-consuming rerouting of signal paths during board layout to accommodate traditional test pads. In addition, test fixtures are less expensive. Manufacturers can implement this technology using current surface-mount board-manufacturing processes with no additional costs or process steps. Bead probes also require simpler test fixtures that take less time to build, hence enabling products to get to market faster because design and test departments require less time to negotiate test-pad locations. Agilent is helping its customers extend their ICT investments by offering royalty-free licenses to use the Medalist Bead Probe Technology on their Agilent ICT equipment. Since the official launch of this licensing program in October 2006, there has been tremendous interest in this technology from various manufacturing segments across the globe. Several key Original Equipment Manufacturers have also signed up for the royalty-free licenses and are in the process of rolling out products using bead probes as their new test methodology, with some ready to go into high-volume production soon. More information on Agilent Medalist Bead Probe Technology can be found at www.agilent.com/see/beadprobe. Product photos are available at www.agilent.com/find/beadprobe_image