Microwave Journal

Agilent Technologies Introduces Industry's First DigRF v3 Measurement Solutions for Mobile Handset Design

February 6, 2007
SANTA CLARA, Calif., Feb. 5, 2007 -- Agilent Technologies Inc. (NYSE: A) today introduced the industry's first DigRF v3 digital serial stimulus and analysis tools, which enable comprehensive cross-domain solutions for handset integration teams, RF-IC developers and BB-IC developers. The Agilent N4850A 312 Mbps digital acquisition probe and the Agilent N4860A 312 Mbps digital stimulus probe for the 16800/900 family of logic analyzers enable development teams to integrate digital and RF measurements to rapidly characterize their products and get to market faster. Handset integration teams can quickly evaluate product behavior by monitoring the digital serial bit stream between the RF-IC and BB-IC. Control flow for DigRF v3 interface is analyzed using protocol decode technology. Digital IQ analysis is achieved using the 89601A vector signal analysis package. Analysis of internal operations, as enabled by the BB-IC visibility port, provides correlation of uC and DSP operation to DigRF v3 traffic. When these capabilities are integrated with RF stimulus and spectrum analysis, handset integrators can characterize the interactions between the RF-IC and the BB-IC to isolate defects and optimize performance. In addition, these solutions enable RF-IC development teams to evaluate their components independent of the BB-IC. For transmitter evaluation, signals are created using Signal Studio software and loaded into the logic analyzer to stimulate the DigRF v3 interface. The resulting RF signal is captured with an N9020A spectrum analyzer so that designers can characterize transmitter behavior and isolate defects. For receiver evaluation, an E4438C ESG vector signal generator stimulates the RF-IC. The digital IQ generated by the RF-IC is acquired by the digital acquisition probe and analyzed using vector signal analysis. Complex RF-IC characteristics like BER can be evaluated by operating the logic analyzer, signal generator and spectrum analyzer under control of Agilent's Advanced Design System RF EDA software. BB-IC development teams can capitalize on the power of the Agilent DigRF v3 solutions to evaluate and tune the behavior of their components. Using the Agilent N4850A acquisition probe, validation teams can analyze transmitted DigRF v3 control and data traffic. A protocol view of control traffic and vector signal analysis of data traffic enable cross-domain debug. With the addition of the Agilent N4860A stimulus probe, the receive path on the BB-IC can be exercised. When used in conjunction with analysis of visibility ports on the BB-IC, DigRF v3 traffic can be correlated to uC and DSP operations, giving the user unprecedented insight into device operation. In summary, the integration of DigRF v3 logic analysis tools and the Agilent RF portfolio provide the cross domain solutions that will enable the rapid deployment of DigRF v3-based products by the wireless industry.