Articles Tagged with ''measurement''

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Agilent Technologies Inc. will present at the Wireless Connectivity in Medical Devices Conference, Nov. 28. at the Langham Boston Hotel in Boston, MA.

Agilent Technologies Inc. announced the extension of its source-corrected noise-figure measurement capability in PNA-X network analyzers to 43.5 and 50 GHz, while continuing to maintain the highest noise-figure measurement accuracy in the industry. Built directly into the Agilent PNA-X, the technique provides a complete single-connection, multiple-measurement capability for R&D and manufacturing engineers developing and testing low-noise transistors, amplifiers, frequency converters and transmit/receive modules.

Agilent Technologies Inc. announced the addition of wireless connectivity to its U1210 Series clamp meter. It also added new capabilities, including voice output and remote hosting, to the Mobile Meter and Mobile Logger applications that support the company’s wireless connectivity solution for handheld digital multimeters and clamp meters.

Agilent Technologies Inc. announced the new webcast, “Calibration Traceability and Standards Compliance,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI.

Texas Instruments Inc. introduced two analog front ends (AFEs) that provide low power, high performance and space savings for test and measurement, wireless communications and optical networking equipment. The AFE7071 is a complete radio transmitter that reduces board space by up to 80 percent compared to discrete implementations. It integrates a dual digital-to-analog converter (DAC), tunable baseband filters, IQ modulator and digital quadrature modulation correction circuit.

The EDI CON 2013 organizers announce that executives from China Mobile Research Institute (CMRI), ZTE and the Beijing Institute of Radio Metrology and Measurements (BIRMM) will take part in the plenary session of the opening day program, presenting their respective emphasis on the system requirements driving high-frequency electronic design trends in China.

National Instruments released its Automated Test Outlook 2013 highlighting the company’s research into the latest test and measurement technologies and methodologies. The report examines trends affecting a variety of industries. 

Agilent Technologies Inc. announced it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).

Following the completion of a £700,000 funding round to expand its overseas sales and device characterization capabilities, Mesuro has announced the enhanced services and capabilities it is now able to offer its customers

Agilent Technologies Inc. announced the 34450A 5½ digit Benchtop Digital Multimeter, designed to turbocharge electronic test and measurement applications for industrial and educational use.