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Articles Tagged with ''measurement''

Anritsu introduces 110 GHz broadband vector network analyzer system

April 9, 2014

Anritsu Co. introduces the VectorStar™ ME7838E Vector Network Analyzer (VNA) broadband system that provides frequency coverage of 70 kHz to 110 GHz in a single connection. Incorporating all the benefits of the VectorStar ME7838 series broadband system, including compact millimeter (mm-wave) modules, best-in-class stability and dynamic range, and fastest measurement speeds, the ME7838E addresses the challenges associated with today’s high-speed device characterization.


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Agilent simplifies discontinuous disturbance measurements with new capabilities in MXE EMI receiver

Test & Measurement
April 3, 2014

Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.


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Agilent, U.C. Berkeley partner to accelerate student learning in engineering

March 20, 2014

Agilent Technologies Inc. announced it will work with the College of Engineering at the University of California, Berkeley, to provide an enhanced learning experience for engineering students using Agilent’s BenchVue software.


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Agilent announces next-generation system for measuring flicker noise

March 14, 2014

Agilent Technologies Inc. introduced the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).


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Agilent to show test and measurement solutions at OFC 2014

March 12, 2014

Agilent Technologies Inc. will show test and measurement solutions at the Optical Fiber Communication Conference & Exposition, March 11-13 in San Francisco, CA. Agilent is the only T&M vendor offering solutions along the entire value chain of the Web 2.0—from components through data centers to telecom, addressing the latest technologies such as silicon photonics and coherent, multi-carrier transmission.


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Accel-RF Instruments introduces automated multi-channel RF-biased burn-in test system

March 12, 2014

Accel-RF Instruments Corp. is the world-leader in supplying equipment for performing measured long-term reliability assessment on compound-semiconductors. To keep up with the shift in GaN from “research novelty” to “market reality”, Accel is expanding its RFBL measurement equipment with the introduction of an 80-Channel RF Bias Burn-In System.


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Aeroflex affirms commitment to 5G research and development

February 27, 2014

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp., announced that it is actively working on developing technologies toward potential Fifth Generation (5G) wireless systems, and is a founding member of the 5G Innovation Centre (5GIC) program, led by the University of Surrey, UK.


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Agilent's newest X-Series measurement application supports LTE-A RF conformance testing to 3GPP Release 11

February 24, 2014

Agilent Technologies Inc. extended its leadership in LTE-Advanced measurement with its latest X-Series measurement application release. The software provides the most comprehensive RF conformance testing of LTE-Advanced FDD and TDD transmitters and components to the 3GPP Release 11 specification. It is available for both benchtop and modular products.


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Lake Shore to discuss new 8500 Series THz system for material characterization at APS

February 21, 2014

Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced that it will be discussing its soon-to-released terahertz (THz) system for materials characterization at the upcoming American Physical Society March Meeting in Denver.


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Agilent’s intuitive, easy-to-use software tool accelerates testing with bench instruments

February 20, 2014

Agilent Technologies Inc. introduced BenchVue, its intuitive, easy-to-use software for the PC that provides multiple-instrument measurement visibility and data capture with no programming necessary. Enabling easy viewing, capturing and exporting of measurement data and screen shots, this no-cost software greatly accelerates testing for engineers and technicians in design and validation.


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