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Articles Tagged with ''measurement''

Teledyne LeCroy’s 10-Bit HDO9000 high definition oscilloscopes broaden the HDO family to 4 GHz

Teledyne LeCroy introduced its latest offering in its high definition oscilloscope line with the HDO9000 high definition oscilloscopes. The HDO9000 uses HD1024 high definition technology that automatically optimizes vertical resolution under each measurement condition to deliver 10 bits of vertical resolution.


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NI announces industry’s highest precision PXI source measure unit

NI announced the NI PXIe-4135 source measure unit (SMU) with a measurement sensitivity of 10 fA and voltage output up to 200 V. Engineers can use the NI PXIe-4135 SMU to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of NI PXI SMUs for applications such as wafer-level parametric test, materials research and characterization of low-current sensors and ICs.


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Anritsu introduces cost-efficient, high-performance signal analyzers

Anritsu Co. expands its Signal Analyzer MS2840A family with the introduction of three models that support the 9 kHz to 3.6 GHz, 6 GHz, and 26.5 GHz frequencies. With the new instruments, Anritsu fills a market void for cost-efficient, high-performance signal analyzers that address the middle frequency ranges, providing an economical solution to accurately measure wireless equipment, oscillators and other components for narrowband applications, land mobile radio, wireless backhaul, radar and automobile electronics.


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