Articles Tagged with ''measurement''

Guy Séné discusses Agilent split

In the first interview about the Agilent spinoff of the Test and Measurement group as a separate company, David Vye, Microwave Journal editor, talks with Guy Séné, president of Agilent's Electronic Measurement Group, about the reasons for the separation and impact on the company.


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ThinkRF receives award for best paper at IEEE AUTOTESTCON 2013

ThinkRF announced that five of its employees have been recognized for their participation in this year’s IEEE AUTOTESTCON. AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.


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Anritsu at EuMW 2013 – Continuing innovation in test methods and equipment technology

Anritsu Co. will be showcasing a wide range of industry leading Test & Measurement solutions at the European Microwave Week 2013, to be held in Nuremburg 8th to 10th October. The newly released MS4640B series of VectorStar vector network analyzers (VNAs) will be on display, together with the MS2830A Spectrum and Signal Analyzers, a range of signal generators, and the handheld RF analyzers, all of which demonstrate different areas of technical leadership.


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Lake Shore to highlight terahertz, other systems at SPIE Optics + Photonics

Lake Shore Cryotronics will exhibit its materials characterization solutions, including its prototype terahertz (THz) system, at booth 623 at SPIE Optics + Photonics, August 27­­­-29 in San Diego. In addition to the new THz system, Lake Shore offers probe stations and Hall measurement systems (HMS) for complex measurements under variable temperature and magnetic field conditions.


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