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Articles Tagged with ''measurement''

Lake Shore to highlight terahertz, other systems at SPIE Optics + Photonics

Lake Shore Cryotronics will exhibit its materials characterization solutions, including its prototype terahertz (THz) system, at booth 623 at SPIE Optics + Photonics, August 27­­­-29 in San Diego. In addition to the new THz system, Lake Shore offers probe stations and Hall measurement systems (HMS) for complex measurements under variable temperature and magnetic field conditions.


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Rohde & Schwarz demonstrates its expertise in T&M at EuMW 2013

European Microwave Week is back in Germany once again. In Nuremberg, Rohde & Schwarz will present its wide range of T&M equipment for microwave applications. Experts from Rohde & Schwarz will also be holding ten workshops and seminars as part of the event program. The following test and measurement highlights will be on display in hall 7A, booth 106 at the NCC:    


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Rohde & Schwarz adds models up to 20 and 40 GHz to its R&S ZNB network analyzer family

More dynamic range and measurement speed in the microwave range: The new R&S ZNB20 and R&S ZNB40 network analyzers now offer these features in the midrange price segment as well. Like all models in the R&S ZNB family, their compact hardware platform requires less space than similar instruments. The advanced 16:9 format touchscreen makes operation easy.


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Re-defining device characterization test as Mesuro launches ‘rapid load pull solution’

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.


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