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Articles Tagged with ''measurement''

Agilent and the University of Leeds open terahertz measurement research lab

Agilent Technologies Inc. announced the opening, at the University of Leeds, of the first Agilent-equipped terahertz measurement laboratory in Europe. The new laboratory will enable research on devices, components, circuits and systems at much higher frequencies than any other institution in the region has been able to do before.


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Agilent expands capabilities of handheld spectrum analyzers for enhanced in-field use

Agilent Technologies Inc. announced expanded capabilities for the N934x C family of rugged handheld spectrum analyzers. The additional features give the HSA enhanced versatility for in-field applications like instrument remote control and peak power measurement of pulsed signals.


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Agilent announces webcast series on calibration service of test and measurement equipment

Agilent Technologies Inc. announced the webcast, “Calibration: Why It Matters and What It Should Include,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI. The webcast will be held Nov. 8.


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Agilent to demonstrate newest microwave and RF design and test solutions at EuMW

Agilent Technologies Inc. announced it will show its newest microwave and RF design, test and measurement solutions for the aerospace, defense, research, education, communications, transportation and medical markets at European Microwave Week (Booth 114), Oct. 29- 31, at the RAI convention center in Amsterdam.


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Agilent to demonstrate LTE and WLAN test and measurement solutions at 4G World

Agilent Technologies Inc. announced it will demonstrate its newest LTE and WLAN test and measurement solutions, which cover the global technology and applications ecosystem for next-generation mobile broadband networks, at 4G World (Booth 322), McCormick Place West,  in Chicago, Oct. 30-31.


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Rohde & Schwarz puts its microwave expertise to the test at EuMW 2012

At European Microwave Week in Amsterdam (hall 3, booths 115/216), Rohde & Schwarz will present highlights from its test and measurement products for microwave applications. In addition, experts from Rohde & Schwarz will impart their expertise to attendees of nine workshops and seminars covering various microwave applications.  


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Agilent congratulates team at CERN for measuring what many thought immeasurable

Agilent Technologies Inc. offers its congratulations to the team at the European Organization for Nuclear Research, more commonly known as CERN, for discovering — at 99.9999 percent confidence — what is almost certainly the long-sought Higgs boson, an elementary particle that had been predicted to exist for theoretical reasons. Agilent is proud to have provided technology that played a part in this landmark discovery.


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Agilent Technologies announces hardware upgrade for ENA Network Analyzers

Agilent Technologies Inc. announced the latest upgrade of the company’s E5071C ENA series network analyzer’s digital hardware, with no price increase. The measurement cycle time of the new hardware is two times faster than that of any other competitive RF network analyzer.


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EDI CON 2013 announces new participants

EDI CON 2013 (March 12-14, Beijing, China), the industry-driven event for RF, microwave and high speed digital electronic design announces the recent addition of several leading RFIC, component and material manufacturers, semiconductor foundries, EDA software and test equipment/solution providers as participants in the technical program and exhibition. As solution providers in high frequency electronic design and system integration, experts from these companies will offer attendees the latest information on the technology used in today’s communications and aerospace industries.


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Aeroflex expands synthetic instrument leadership with integrated test system

TestBench

Aeroflex 7700Aeroflex Inc. announced the availability of the 7700 integrated microwave test system, a bench-sized instrument that utilizes Aeroflex’s synthetic architecture and Common Platform hardware to achieve fast measurement throughput.


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