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Articles Tagged with ''measurement''

ADI's RMS power detector offers unparalleled frequency performance and flexibility

Analog Devices Inc. (ADI), a world leader in high-performance semiconductors for signal processing applications and RF ICs, introduced a high performance RMS power detector. Featuring operation up to 10 GHz and a 67 dB measurement range, the ADL5906 TruPwr™ RMS detector is frequency versatile and eliminates the need for external input tuning devices, such as a balun.


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Agilent introduces wireless communications test set with integrated multiport adapter

Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.


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Lake Shore CVT probes improve efficiency and accuracy of probe station measurement

Lake Shore announces a new continuously variable temperature (CVT) probe, developed in collaboration with TOYO Corp., that allows for true, continuous unattended wafer probing of a material sample across a range of temperatures. The probes, when used in any Lake Shore probe station, significantly improve reliability of sample measurement.


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