Lake Shore Cryotronics will exhibit its materials characterization solutions, including its prototype terahertz (THz) system, at booth 623 at SPIE Optics + Photonics, August 27-29 in San Diego. In addition to the new THz system, Lake Shore offers probe stations and Hall measurement systems (HMS) for complex measurements under variable temperature and magnetic field conditions.
European Microwave Week is back in Germany once again. In Nuremberg, Rohde & Schwarz will present its wide range of T&M equipment for microwave applications. Experts from Rohde & Schwarz will also be holding ten workshops and seminars as part of the event program. The following test and measurement highlights will be on display in hall 7A, booth 106 at the NCC:
S.E.A. Datentechnik, a long-term National Instruments Alliance Partner, is launching a series of mobile communication modules that are designed specifically for the NI CompactRIO platform equipped with the new Zynq-based NI cRIO-9068 controller.
RFMW Ltd. announces design and sales support for two new broad band, high-performance switches from Peregrine Semiconductor. Targeting the test and measurement market, the PE42520 and PE42521 SPDT switches offer performance to 13GHz at a 36dBm power rating. The resulting input IP3 (IIP3) is 66dBm while IIP2 is 115 dBm.
More dynamic range and measurement speed in the microwave range: The new R&S ZNB20 and R&S ZNB40 network analyzers now offer these features in the midrange price segment as well. Like all models in the R&S ZNB family, their compact hardware platform requires less space than similar instruments. The advanced 16:9 format touchscreen makes operation easy.
Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.