Articles Tagged with ''probe''

New near-field probe with high resolution up to 10 GHz from Langer EMV-Technik

The SX probe heads' high measurement resolution allows the developer to pinpoint RF sources of between 1 and 10 GHz on densely packed printed circuit boards or on IC pins. The handy compact pin shape of the EMC near-field probes from Langer EMV-Technik GmbH provides the developer with convenient working conditions on the respective PCB.


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Lake Shore to show high-frequency probing & characterization technology at EuMW

 Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced it will be exhibiting Oct. 7–9 during the 44th European Microwave Week (EuMW) conference in Rome, Italy, where it will discuss its platforms for the study of devices and materials using high-frequency measurements. 


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Lake Shore to highlight terahertz, other systems at SPIE Optics + Photonics

Lake Shore Cryotronics will exhibit its materials characterization solutions, including its prototype terahertz (THz) system, at booth 623 at SPIE Optics + Photonics, August 27­­­-29 in San Diego. In addition to the new THz system, Lake Shore offers probe stations and Hall measurement systems (HMS) for complex measurements under variable temperature and magnetic field conditions.


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