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Articles Tagged with ''analysis''

Agilent unveils new IC-CAP platform for device characterization and modeling

EDAFocus
December 20, 2012

With IC-CAP 2013.01, Agilent introduces major improvements to its flagship product for high-frequency device modeling. One key improvement is turnkey extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices.


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Boeing test breakthrough means more reliable connectivity on airplanes

MarketWatch: Defense
December 20, 2012

Boeing has developed an advanced method to test wireless signals in airplane cabins, making it possible for passengers to enjoy more reliable connectivity when using networked personal electronic devices in the air.


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Agilent demonstrates test solutions at SDR-WInnComm

December 21, 2012

Agilent will demonstrate the following test solutions:


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Agilent announces application note on the 89600 VSA software simultaneous multi-measurement capabilities

EDAFocus
December 26, 2012

Agilent’s new application note describes how the 89600 VSA software’s multi-measurement capability facilitates testing wireless devices and systems handling multiple carriers and formats at the same time.


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Agilent introduces industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions

TestBench
January 3, 2013

Agilent introduced the industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions. The offerings complement Agilent's other industry-first solutions for the LTE-Advanced standard.


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Handheld Tektronix spectrum analyzers use DPX to track elusive signals in the field

January 9, 2013

Tektronix Inc., a leading innovator of signal generation and analysis solutions required for the microwave and RF industry, today announced the H500 and SA2500 Handheld Spectrum Analyzers that include DPX™ waveform image processor technology to provide a live RF view of the spectrum. With unique DPX technology along with built-in mapping and signal classification features in a compact, ruggedized package, the instruments are designed to allow spectrum regulators to efficiently manage and monitor spectrum in the field and hunt down elusive signals and interferers.


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Agilent introduces benchtop digital multimeter designed to turbocharge electronic T&M applications

January 22, 2013

Agilent Technologies Inc. announced the 34450A 5½ digit Benchtop Digital Multimeter, designed to turbocharge electronic test and measurement applications for industrial and educational use.


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Tektronix boosts mid-range real-time spectrum analyzer series performance

TestBench
January 23, 2013

Tektronix Inc. announced the lowest cost real-time spectrum analyzer for mid-range performance, featuring the industry’s most advanced signal discovery and triggering capabilities: the RSA5000 Real-Time Spectrum Analyzer Series.


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CST to distribute Optenni Lab worldwide

January 23, 2013

CST is pleased to announce that the Optenni Lab™ matching circuit optimization software is now available through the global CST sales channels. Optenni Lab will be fully supported by the CST sales and technical support teams distributors worldwide.


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Agilent announces video on 8x8 LTE MIMO

January 28, 2013

Agilent Technologies Inc. announced a new video, "8x8 LTE MIMO Analysis - N7109A Signal Analyzer - 89600 VSA - SystemVue."  See how new 8x8 MIMO simulation and measurement capabilities help LTE basestation designers stay ahead of rapidly evolving LTE standards test requirements.


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