Articles Tagged with ''instruments''

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Agilent Technologies Inc. announced the opening of a new calibration and repair service center for electronic test instruments in Hanoi, Vietnam. The new Agilent Advantage Services facility will offer local calibration and repair services, adding to more than 50 service locations around the world.

Agilent Technologies Inc. announced the Agilent U8480 Series, the world’s fastest USB thermocouple power sensors. Based on the same front-end design as the Agilent 8480 and N8480 Series power sensors, the new U8480 Series offers improved specifications, including a measurement speed of 400 readings per second, 10 times faster than the legacy series.

National Instruments announced the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. 

National Instruments announced 10 pieces of new application IP that enable engineers and scientists to use NI LabVIEW system design software to build their own custom RF instruments. This IP integrates with PXI FPGA targets such as the NI PXIe-5644R VST and extends their default capabilities.

Keithley Instruments Inc. announces enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high power semiconductor characterization solutions. 

With the recent introduction of its new light weight, battery powered, 2 x 20W iPA PIM Analyzer, Kaelus is offering a trade-in program for customers wanting to replace their existing portable test instruments with the newest Kaelus PIM test equipment available.

National Instruments announced the promotion of Eric Starkloff to senior vice president of marketing. Starkloff leads the organizations responsible for strategic planning, positioning the company’s innovative hardware and software platforms, marketing NI’s products and corporate brand, and creating an effective eBusiness platform.

Agilent Technologies Inc. announced the latest enhancement on its Command Expert software for faster and easier instrument control in many test application development environments.