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Articles Tagged with ''measurements''

Agilent introduces basic spectrum analyzer for budget-driven applications

November 30, 2012

Agilent Technologies Inc. announced a new basic spectrum analyzer for budget-constrained applications in R&D, manufacturing, maintenance, educationlabs, spectrum management, benchrepair and other general-purpose analyzer applications.


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Anritsu introduces handheld spectrum analyzers with unprecedented performance up to 43 GHz

TestBench
December 20, 2012

The MS2720T features a touchscreen, full-band tracking generators to 20 GHz, and best-in-class performance for dynamic range, DANL, phase noise, and sweep speed, providing unprecedented levels of spectrum monitoring, hidden signal detection, RF/microwave measurements, and testing of microwave backhauls and cellular signals.


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Rohde & Schwarz introduces new probes for high bandwidths and voltages

December 20, 2012
In addition to various new options for its oscilloscopes, Rohde & Schwarz has continued to expand its range of probes as well: Available for the first time on the market, there is now a broadband, ground-referenced model with a range up to 6 GHz. A differential high-voltage probe is also available.
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Agilent announces application note on the 89600 VSA software simultaneous multi-measurement capabilities

EDAFocus
December 26, 2012

Agilent’s new application note describes how the 89600 VSA software’s multi-measurement capability facilitates testing wireless devices and systems handling multiple carriers and formats at the same time.


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Rohde & Schwarz to present enhanced oscilloscopes at embedded world 2013

January 10, 2013

New bandwidths, mixed-signal analysis and options for testing USB interfaces, CAN LIN buses and audio signals: Rohde & Schwarz significantly expanded its oscilloscope portfolio in 2012. At the embedded world 2013 trade fair in Nuremberg (hall 4, booth 112), the company will present its latest applications, two new probes and other state-of-the-art products.


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AWR releases V10.04 – new upgrade to the AWR Design Environment

EDAFocus
January 22, 2013

AWR Corp. has announced AWR Design Environment V10.04, its first new software release in 2013, which includes many new features and enhancements to Microwave Office/Analog Office and Visual System Simulator, as well as AXIEM and Analyst.


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Tektronix boosts mid-range real-time spectrum analyzer series performance

TestBench
January 23, 2013

Tektronix Inc. announced the lowest cost real-time spectrum analyzer for mid-range performance, featuring the industry’s most advanced signal discovery and triggering capabilities: the RSA5000 Real-Time Spectrum Analyzer Series.


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AWR announces a new frequency planning wizard

January 23, 2013

AWR Corp., the innovation leader in high-frequency EDA software, today announces RFP™, an innovative new frequency planning wizard within Visual System Simulator™ (VSS) that enables engineers to effortlessly and efficiently determine spurious free bandwidths when designing complex radio communications systems.


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Agilent introduces world’s fastest USB thermocouple power sensors with best linearity and accuracy

January 23, 2013

Agilent Technologies Inc. announced the Agilent U8480 Series, the world’s fastest USB thermocouple power sensors. Based on the same front-end design as the Agilent 8480 and N8480 Series power sensors, the new U8480 Series offers improved specifications, including a measurement speed of 400 readings per second, 10 times faster than the legacy series.


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NI intros digitizer and updated LabVIEW Jitter Analysis Toolkit

Software/EDA Channel
February 5, 2013

National Instruments announced the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. 


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