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Articles Tagged with ''measurements''

NSN, NYU WIRELESS host first Brooklyn 5G Summit

April 18, 2014

Nokia Solutions and Networks and the NYU WIRELESS Research Center at the New York University Polytechnic School of Engineering are jointly organizing the first Brooklyn 5G Summit, held April 23-25 in Brooklyn, New York. The invitation-only event will bring together wireless and mobile industry research and development leaders in academia, business and government to explore the future of 5G wireless technology, with special focus on antennas, propagation and channel modeling.


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Agilent simplifies discontinuous disturbance measurements with new capabilities in MXE EMI receiver

Test & Measurement
April 3, 2014

Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.


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Agilent's VSA software now offers proprietary signal analysis capabilities

Software/EDA
March 6, 2014

Agilent Technologies Inc. announced that its 89600 VSA software has been enhanced with custom IQ modulation analysis. The analysis capability speeds time to insight by allowing R&D engineers to more easily test proprietary signals forsatellite and military communication applications.


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Auriga's Dr. Shen-Schultz to present at EDI CON 2014

March 3, 2014

Dr. Qin Shen-Schultz, principal engineer at Auriga Microwave, will present two technical papers at this year's Electronic Design Innovation Conference (EDI CON).


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Tektronix offers six instruments in one oscilloscope

Test & Measurement
February 25, 2014

Tektronix Inc. announced the MDO3000 Series of mixed domain oscilloscopes. The ultimate integrated oscilloscope  includes a spectrum analyzer, logic analyzer, protocol analyzer, arbitrary function generator and digital voltmeter


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Agilent's newest X-Series measurement application supports LTE-A RF conformance testing to 3GPP Release 11

February 24, 2014

Agilent Technologies Inc. extended its leadership in LTE-Advanced measurement with its latest X-Series measurement application release. The software provides the most comprehensive RF conformance testing of LTE-Advanced FDD and TDD transmitters and components to the 3GPP Release 11 specification. It is available for both benchtop and modular products.


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Lake Shore to discuss new 8500 Series THz system for material characterization at APS

February 21, 2014

Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced that it will be discussing its soon-to-released terahertz (THz) system for materials characterization at the upcoming American Physical Society March Meeting in Denver.


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Anritsu introduces world’s first 40 GHz handheld cable and antenna analyzer

Test & Measurement
January 31, 2014

Anritsu Co. introduces the Microwave Site Master S820E, the world’s first handheld cable and antenna analyzer with frequency coverage up to 40 GHz, which continues Anritsu’s leadership position in the handheld analyzer market it established with the first broadband Site Master over 15 years ago.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

January 24, 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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GoldenGate 2013.10 RFIC Software

Software/EDA
January 6, 2014

GG_(shared)-01Agilent Technologies Inc. announced the release of GoldenGate, its RFIC simulation, verification and analysis software. Agilent EEsof EDA’s GoldenGate 2013.10 provides RFIC designers with easy-to-use EVM-, BER- and ACPR-type measurements and enables them to quickly analyze and diagnose problem areas in large-signal analysis.


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