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Articles Tagged with ''measurements''

Cascade Microtech introduces Velox 2.0 probe station control software

Software/EDA

Cascade Microtech Inc., a leading supplier of solutions that enable precision measurements of integrated circuits at the wafer level, announced Velox 2.0, the latest version of their probe station control software. Combining the ease of Nucleus™ with the power of ProberBench™, Velox 2.0 delivers new levels of test and measurement efficiency to accelerate time to job completion.


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Anritsu adds LTE-advanced carrier aggregation test capability to BTS Master

 Anritsu Co. introduces functionality for its BTS Master™ MT8220T base station analyzer that allows field engineers and technicians to conduct highly accurate and efficient LTE-Advanced Carrier Aggregation (CA) measurements during network deployment and maintenance.  


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Small Wavelengths – Big Potential: Millimeter Wave Propagation Measurements for 5G

TEGAM's new microohmmeter probes are rugged and comfortable

 TEGAM, Inc., a leading supplier of innovative microohmmeters introduces five new Kelvin probes.  


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Anite launches Nemo in-building coverage meter

 Anite, a global leader in wireless network testing technology, announced the release of Nemo In-Building Coverage Meter (Nemo IBC Meter), an industry first professional solution for wireless service reporting in the field. Developed for operators’ corporate sales executives, the application enables fast ‘test and check’ to identify how well the network performs in premises, instantly verifying the quality of network performance and automatically reporting data back to the operator’s network planning teams. 


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Multi-Channel Antenna Calibration Reference Solution

Agilent’s Waveform Generator/Fast Measurement unit used at IIT Bombay

Agilent Technologies Inc. announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.


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RF VNAs: ShockLine MS46522A

shocklineAnritsu Co. addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.


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ZigBee RF Power Measurements in the Field

Device Technology and VNA Architecture for Broadband Device Characterization

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