Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.
Developers of wireless products that need to push to the higher communication bands now have access to an affordable VNA for operation up to 6 GHz. The new MegiQ VNA-0460 VNA measures impedances and other S-parameters from 400 MHz up to 6 GHz.
Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, will be exhibiting a forthcoming terahertz (THz) frequency on-wafer cryogenic probing arm at next week’s 10th European Conference on Antennas and Propagation (EuCAP) in Davos, Switzerland.
The Keysight CX3300 Series Device Current Waveform Analyzer is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices.
Cirexx International announced that they have acquired and installed a Micro-Vu Excel Measuring Center. This sophisticated machine will complement Cirexx’s current printed circuit board inspection, test and measurement equipment.