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Articles Tagged with ''measurements''

Agilent’s Waveform Generator/Fast Measurement unit used at IIT Bombay

June 12, 2014

Agilent Technologies Inc. announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.


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Anritsu's family of RF VNAs for variety of passive device testing environments

June 5, 2014

Anritsu Co. addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.


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China NIM selects Anritsu VectorStar™ broadband system

April 23, 2014

Anritsu Corporation Microwave Measurement Division (MMD) announces that the China National Institute of Metrology (NIM) Microwave Parameters Lab has selected the Anritsu VectorStar™ ME7838A 110 GHz broadband Vector Network Analyzer (VNA) system. The lab will use the advanced test solution to develop standards for on-wafer S-parameter calibration procedures.


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NSN, NYU WIRELESS host first Brooklyn 5G Summit

April 18, 2014

Nokia Solutions and Networks and the NYU WIRELESS Research Center at the New York University Polytechnic School of Engineering are jointly organizing the first Brooklyn 5G Summit, held April 23-25 in Brooklyn, New York. The invitation-only event will bring together wireless and mobile industry research and development leaders in academia, business and government to explore the future of 5G wireless technology, with special focus on antennas, propagation and channel modeling.


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Agilent simplifies discontinuous disturbance measurements with new capabilities in MXE EMI receiver

Test & Measurement
April 3, 2014

Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.


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Agilent's VSA software now offers proprietary signal analysis capabilities

Software/EDA
March 6, 2014

Agilent Technologies Inc. announced that its 89600 VSA software has been enhanced with custom IQ modulation analysis. The analysis capability speeds time to insight by allowing R&D engineers to more easily test proprietary signals forsatellite and military communication applications.


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Auriga's Dr. Shen-Schultz to present at EDI CON 2014

March 3, 2014

Dr. Qin Shen-Schultz, principal engineer at Auriga Microwave, will present two technical papers at this year's Electronic Design Innovation Conference (EDI CON).


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Tektronix offers six instruments in one oscilloscope

Test & Measurement
February 25, 2014

Tektronix Inc. announced the MDO3000 Series of mixed domain oscilloscopes. The ultimate integrated oscilloscope  includes a spectrum analyzer, logic analyzer, protocol analyzer, arbitrary function generator and digital voltmeter


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