Articles Tagged with ''measurements''

Bluetest Prepares for 5G

Bluetest is introducing a 5G extension package to the RTS65 reverberation chamber that enables MIMO OTA measurements for initial trials and deployments of 5G applications.


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Rohde & Schwarz Introduces 2 GHz Bandwidth Probe

2 GHz Bandwidth Probe: RT-ZPR20

Rohde & Schwarz has introduced the R&S RT-ZPR20, extremely low-noise power rail probe with a bandwidth of 2 GHz. Its 1:1 attenuation also ensures very good sensitivity. The large offset range of ± 60 V permits analysis of the smallest disturbance signals during power integrity measurements, even on DC power supplies with a high voltage level. The probe also features an integrated high-precision DC voltmeter. The quality of the power supply is a key factor in the functionality and performance of sensitive electronic circuits.


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Keysight integrates low-frequency noise measurements in wafer level solution platform

Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.


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New affordable 6 GHz VNA from MegiQ

Developers of wireless products that need to push to the higher communication bands now have access to an affordable VNA for operation up to 6 GHz. The new MegiQ VNA-0460 VNA measures impedances and other S-parameters from 400 MHz up to 6 GHz.


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