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Articles Tagged with ''measurements''

Keysight integrates low-frequency noise measurements in wafer level solution platform

Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.


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New affordable 6 GHz VNA from MegiQ

Developers of wireless products that need to push to the higher communication bands now have access to an affordable VNA for operation up to 6 GHz. The new MegiQ VNA-0460 VNA measures impedances and other S-parameters from 400 MHz up to 6 GHz.


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Lake Shore to showcase cryogenic terahertz probing solution at EuCAP conference

Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, will be exhibiting a forthcoming terahertz (THz) frequency on-wafer cryogenic probing arm at next week’s 10th European Conference on Antennas and Propagation (EuCAP) in Davos, Switzerland.


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Keysight unveils new category of analyzer for advanced device characterization

The Keysight CX3300 Series Device Current Waveform Analyzer is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices.


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Keysight introduces analyzer for design, test of three-phase power devices

Keysight Technologies, Inc. announced an extension to the IntegraVision family of power analyzers, the first in the industry to combine high-accuracy power measurements and touch-driven oscilloscope visualization in a single instrument. The Keysight IntegraVision PA2203A 4-channel power analyzer gives R&D engineers working on three-phase power devices an intuitive tool that delivers the dynamic views they need to see, measure and prove design performance.


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