Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.
Developers of wireless products that need to push to the higher communication bands now have access to an affordable VNA for operation up to 6 GHz. The new MegiQ VNA-0460 VNA measures impedances and other S-parameters from 400 MHz up to 6 GHz.
Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, will be exhibiting a forthcoming terahertz (THz) frequency on-wafer cryogenic probing arm at next week’s 10th European Conference on Antennas and Propagation (EuCAP) in Davos, Switzerland.
The Keysight CX3300 Series Device Current Waveform Analyzer is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices.
Cirexx International announced that they have acquired and installed a Micro-Vu Excel Measuring Center. This sophisticated machine will complement Cirexx’s current printed circuit board inspection, test and measurement equipment.
Keysight Technologies, Inc. announced an extension to the IntegraVision family of power analyzers, the first in the industry to combine high-accuracy power measurements and touch-driven oscilloscope visualization in a single instrument. The Keysight IntegraVision PA2203A 4-channel power analyzer gives R&D engineers working on three-phase power devices an intuitive tool that delivers the dynamic views they need to see, measure and prove design performance.