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Articles Tagged with ''measurements''

TEGAM's new microohmmeter probes are rugged and comfortable

 TEGAM, Inc., a leading supplier of innovative microohmmeters introduces five new Kelvin probes.  


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Anite launches Nemo in-building coverage meter

 Anite, a global leader in wireless network testing technology, announced the release of Nemo In-Building Coverage Meter (Nemo IBC Meter), an industry first professional solution for wireless service reporting in the field. Developed for operators’ corporate sales executives, the application enables fast ‘test and check’ to identify how well the network performs in premises, instantly verifying the quality of network performance and automatically reporting data back to the operator’s network planning teams. 


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Multi-Channel Antenna Calibration Reference Solution

Agilent’s Waveform Generator/Fast Measurement unit used at IIT Bombay

Agilent Technologies Inc. announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.


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Anritsu's family of RF VNAs for variety of passive device testing environments

Anritsu Co. addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.


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ZigBee RF Power Measurements in the Field

Device Technology and VNA Architecture for Broadband Device Characterization

China NIM selects Anritsu VectorStar™ broadband system

Anritsu Corporation Microwave Measurement Division (MMD) announces that the China National Institute of Metrology (NIM) Microwave Parameters Lab has selected the Anritsu VectorStar™ ME7838A 110 GHz broadband Vector Network Analyzer (VNA) system. The lab will use the advanced test solution to develop standards for on-wafer S-parameter calibration procedures.


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NSN, NYU WIRELESS host first Brooklyn 5G Summit

Nokia Solutions and Networks and the NYU WIRELESS Research Center at the New York University Polytechnic School of Engineering are jointly organizing the first Brooklyn 5G Summit, held April 23-25 in Brooklyn, New York. The invitation-only event will bring together wireless and mobile industry research and development leaders in academia, business and government to explore the future of 5G wireless technology, with special focus on antennas, propagation and channel modeling.


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Agilent simplifies discontinuous disturbance measurements with new capabilities in MXE EMI receiver

Test & Measurement

Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.


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