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Agilent Technologies Inc. announced that its electronic test equipment will be used by NXP Semiconductors N.V. in a demonstration of its beam-forming technology for the next generation of communication and radar products at the International Consumer Electronics Show in Las Vegas, Jan. 10-13.
RF Micro Devices Inc. announced it will showcase its broad portfolio of products and technologies for the wireless and wired broadband markets at the upcoming IEEE International Microwave Symposium (IMS), held
A paper describing the conceptual design and technology behind the TanDEM-X satellite system for mapping the Earth’s topography with high resolution and high accuracy, authored by a team of researchers from the German Aerospace Center’s Microwaves and Radar Institute, is being honored by IEEE with the 2012 IEEE W.R.G. Baker Award.
STMicroelectronics has been awarded the prestigious 2012 Corporate Award from the IEEE Standards Association) in recognition of its advancement of standards in electrical and electronics engineering.
RF Micro Devices Inc., a global leader in the design and manufacture of high-performance radio frequency components, announced that RFMD Fellow Kevin W. Kobayashi has been named a Fellow of the Institute of Electrical and Electronics Engineers (IEEE) by the IEEE Board of Directors.
The Wireless Gigabit (WiGig) Alliance, which formally contributed to the IEEE 802.11ad standard process, has heralded its publication as a critical moment in bringing a global wireless ecosystem of interoperable, high performance devices that work together seamlessly.
Computer Simulation Technology (CST), Darmstadt, announces winners of the CST University Publication Award 2012. The CST University Publication Award is an annual grant to university institutes and researchers for work related to 3D EM field simulation applications. The winners are awarded extensions and upgrades to their CST STUDIO SUITE® installations to recognize the importance of their work and to promote further research.
Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.
Rohde & Schwarz has tailored its mid-range measuring instruments to handle WLAN signals in line with IEEE 802.11ac. Using the R&S SMBV100A and R&S FSV, manufacturers of WLAN chipsets, components and devices can now easily generate and analyze signals with 160 MHz bandwidth.
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