Anite, a global leader in wireless equipment testing technology, announced that it has introduced support for Coordinated Multipoint (“CoMP”) in its interoperability, performance and conformance device test solutions SAS and Conformance Toolset.
Anritsu Co. announces it successfully completed testing of GCT Semiconductor’s 4G LTE-Advanced chip, GDM7243Q, using Anritsu’s MD8430A signaling tester with Rapid Test Designer (RTD). GCT Semiconductor, a leading designer and supplier of advanced 4G mobile semiconductor solutions, offers an advanced FDD-TDD LTE Category 5/6/7 single chip, with the world’s first 4X4 MIMO carrier aggregation for LTE.
Anite has signed a memorandum of understanding with China Telecommunication Technology Labs – Terminals, with the aim of collaborating to progress development of cutting-edge MIMO Over-The-Air testing methodologies and solutions.
Microsemi Corp., a leading provider of semiconductor solutions differentiated by power, security, reliability and performance, today announced its award-winning TimeProvider® 5000 Software Release 2.2, adding ITU-T G.8275.1 phase synchronization profile support with a software upgrade and license key. The new software release now supports Synchronous Ethernet and the IEEE 1588 Precision Time Protocol (PTP) phase profile.
LTE-Advanced networks have been actively deployed around the world. At the end of 2014, LTE-Advanced covered its first 100 million people worldwide, just four years since the network’s inception. ABI Research predicts that the coverage will reach 1 billion in four more years.
Anite has signed an agreement with China Academy of Information and Communications Technology whereby the two will collaborate on the development of new advanced test scenarios to verify the performance of TD-LTE and LTE-Advanced devices and network infrastructure.