Articles Tagged with ''anritsu''

Anritsu at EuMW 2013 – Continuing innovation in test methods and equipment technology

Anritsu Co. will be showcasing a wide range of industry leading Test & Measurement solutions at the European Microwave Week 2013, to be held in Nuremburg 8th to 10th October. The newly released MS4640B series of VectorStar vector network analyzers (VNAs) will be on display, together with the MS2830A Spectrum and Signal Analyzers, a range of signal generators, and the handheld RF analyzers, all of which demonstrate different areas of technical leadership.


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Anritsu LTE network simulator provides world’s first support for TD-LTE carrier aggregation

Test & Measurement

Anritsu Co. introduces software enhancements to its MD8430A Signaling Tester that make it the first LTE network simulator to support Time Division Duplex LTE (TD-LTE) Carrier Aggregation (CA) test functionality. The MD8430A is the industry’s leading platform for device testing from development to certification and carrier acceptance.


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Remote control capability for industry-leading handheld instruments introduced by Anritsu

Software/EDA

Anritsu Co. introduces Wireless Remote Tools for its touchscreen PIM Master™, Site Master™, Spectrum Master™, and VNA Master™ handheld instruments. With the software installed, field technicians and engineers can remotely view screens and control the industry-leading field instruments using a Windows™-based laptop, PC or tablet, simplifying the deployment, installation, and maintenance of 2G/3G/4G wireless networks.


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Anritsu makes first LTE-Advanced protocol conformance test verification submissions

Anritsu Corp. announces its first LTE-Advanced (LTE-A) Carrier Aggregation (CA) test case submissions to RAN 5, demonstrating a strength in protocol conformance that extends across current 2G, 3G, and leading-edge LTE technology. This follows its recent world first in validating RF conformance test cases for CA in PTCRB.  RAN 5 verification paves the way for protocol test validations and the inclusion of this technology in GCF and PTCRB certification.


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Anritsu to showcase test solutions that address high-frequency designs at IMS 2013

Anritsu Co. (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.  


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