advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Articles Tagged with ''agilent''

Agilent ships newest EMPro software release for analyzing 3-D electromagnetic effects

November 16, 2012

Agilent Technologies Inc. announced shipment of EMPro 2012, its 3-D electromagnetic simulation software.


Read More

Agilent to present at Wireless Connectivity in Medical Devices conference

November 19, 2012

Agilent Technologies Inc. will present at the Wireless Connectivity in Medical Devices Conference, Nov. 28. at the Langham Boston Hotel in Boston, MA.


Read More

Agilent ships newest GoldenGate software release for RFIC designers

November 20, 2012

Agilent Technologies Inc. announced shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.


Read More

Agilent recognized by Frost & Sullivan for outstanding customer service in Brazil

November 20, 2012

Agilent Technologies Inc. announced that Frost & Sullivan recognized the company for significant customer-centric initiatives and leadership in Brazil’s electronic test and measurement market, presenting Agilent with the 2012 Brazilian Frost & Sullivan Award for Customer Service Leadership.


Read More

Agilent opens PicoCafé, an online forum for atomic force microscope users

November 28, 2012

Agilent Technologies Inc. announced the launch of its online Pico Café, an interactive web community created exclusively for atomic force microscope users. Agilent AFM users from around the world are invited to visit the new PicoCafé at www.agilent.com/find/picocafe to share original script programming and instrumentation-related insights with one another.


Read More

Agilent extends high-performance noise-figure measurement technique to 50 GHz

November 29, 2012

Agilent Technologies Inc. announced the extension of its source-corrected noise-figure measurement capability in PNA-X network analyzers to 43.5 and 50 GHz, while continuing to maintain the highest noise-figure measurement accuracy in the industry. Built directly into the Agilent PNA-X, the technique provides a complete single-connection, multiple-measurement capability for R&D and manufacturing engineers developing and testing low-noise transistors, amplifiers, frequency converters and transmit/receive modules.


Read More

Agilent introduces basic spectrum analyzer for budget-driven applications

November 30, 2012

Agilent Technologies Inc. announced a new basic spectrum analyzer for budget-constrained applications in R&D, manufacturing, maintenance, educationlabs, spectrum management, benchrepair and other general-purpose analyzer applications.


Read More

Agilent adds wireless connectivity to clamp meters

December 3, 2012

Agilent Technologies Inc. announced the addition of wireless connectivity to its U1210 Series clamp meter. It also added new capabilities, including voice output and remote hosting, to the Mobile Meter and Mobile Logger applications that support the company’s wireless connectivity solution for handheld digital multimeters and clamp meters.


Read More

Agilent announces new webcast on calibration service for test and measurement equipment

December 5, 2012

Agilent Technologies Inc. announced the new webcast, “Calibration Traceability and Standards Compliance,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI.


Read More

Agilent Wireless Symposium tours UK in January 2013

December 10, 2012

Agilent Technologies Inc. has announced its annual Wireless Symposium focused on design, conformance and manufacturing, which will tour the UK in January 2013.


Read More

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up