Articles Tagged with ''testing''

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Rohde & Schwarz has introduced a fading simulation module for its R&S CMW500 wideband radio communication tester.

AT4 wireless and Anritsu Co. announce an agreement to bring Anritsu test equipment for 3G and LTE conformance and carrier testing to the AT4 wireless leading network of testing laboratories.

Azimuth Systems Inc., a provider of automated, real-world mobile performance test solutions, announced new capabilities for the ACE™channel emulation portfolio that directly address LTE-Advanced test requirements.

Agilent Technologies Inc. introduced compliance testing support for Energy-Efficient Ethernet (EEE) standards used in networking applications. Agilent’s solution for transmitter tests includes 10BASE-T, 100BASE-T and 1000BASE-T EEE test standards as described in the IEEE 802.3az-2010 specification.

Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.

Teseq Inc., a leading developer and provider of instrumentation and systems for EMC emission and immunity testing, now offers a double-ridged horn antenna that has a frequency range of 6 to 18 GHz.  The new PMM DR-01 is designed for radiated emissions and immunity applications, featuring an antenna factor of 36 dB/m to 41 dB/m and excellent sensitivity for emissions measurements. 

AR RF/Microwave Instrumentation has introduced the Model 350AH1 solid state amplifier. This portable, self-contained, 350 watt/10 Hz to 1 MHz unit provides power, durability and dependability along with the versatility for a wide range of applications.

Aeroflex Inc. announced the POCSAG testing option for the 3920 Series Digital Radio Test Set. With this option, the 3920 Series can now be used to verify the operation of POCSAG pagers and paging systems.

Tektronix Inc. announced the industry’s first demonstration of a M-PHY test solution for silicon-proven HS-Gear3 IP, a key part of the MIPI Alliance M-PHY physical layer specification for mobile devices. The Tektronix test solution allows designers to quickly and efficiently characterize designs and verify performance.

Anite, a global leader in wireless equipment testing technology, was presented with an Innovation Award by a representative of China Mobile at an evening event hosted by Global TD-LTE Initiative (GTI) during the GSMA Mobile World Congress 2013 in Barcelona on the 26th of February. The award recognised Anite’s achievements as a leading vendor of wireless test solutions and in particular its interoperability test solution, SAS.