advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Articles Tagged with ''clock''

Analog Devices' low-jitter 1.25-GSPS clock

 Analog Devices Inc.  introduced the AD9528 JESD204B clock and SYSREF generator defined to support the clock requirements for long-term evolution (LTE) and multicarrier GSM base station designs, defense electronics systems, RF test instrumentation, and other emerging wideband RF GSPS data acquisition signal chains. 


Read More

Differential XO: VC-826

 

Vectron International announces the VC-826 differential XO in a 3225 (3.2 x 2.5 mm) package. The VC-826 XO is designed to support applications that require low jitter (under 200 fsec) at standard frequencies from 20 to 170 MHz. Vectron's VC–826 is designed for use with PHY/SERDES, high speed converters, ASICs and FPGAs in communications platforms, medical and industrial markets.


Read More

Silicon Labs launches industry’s lowest jitter clock family for Internet applications

 Silicon Labs, a leader in high-performance, analog-intensive, mixed-signal ICs, introduced the industry’s most frequency-flexible clock solutions offering industry-leading jitter performance for high-speed networking, communications and data center equipment serving as the foundation of today’s Internet infrastructure. 


Read More

Handheld Spectrum Analyzer: MS2720T

MS2720T Spectrum Master

Anritsu's internal atomic clock option for its MS2720T Spectrum Master handheld spectrum analyzer allows users to acquire excellent frequency accuracy, including in environments in which the GPS cannot be used. Integrating the atomic clock inside the MS2720T provides field engineers and technicians with a durable, handheld spectrum analyzer that can deliver the extremely high accuracy necessary to prove regulatory compliance.


Read More

Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


Read More

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement