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Articles Tagged with ''anite''
SGS has selected Anite’s Propsim channel emulators for its new anechoic MIMO Over-The-Air test laboratory in Taiwan.
An Anite-led task group within the METIS project has published the world’s first channel models for 5G.
Anite, a global leader in wireless equipment testing technology, announced that it is first to offer chipset and device manufacturers the ability to verify their 4x4 Downlink (DL) MIMO designs and products, accelerating the development of LTE and LTE-Advanced devices. The milestone was achieved in close collaboration with a leading device manufacturer using Anite’s Development Toolset - an easy to use solution for early stage testing..
Anite has announced its participation in a project initiated by Intel to develop ‘virtualised’ testing environments in order to accelerate 4G and 5G technology development and testing.
Anite has been selected to supply additional device testing systems to a major Chinese mobile operator for its TD-LTE device acceptance programme.
Anite has launched a major multi-link emulation enhancement to its Propsim channel emulator platform, significantly increasing the performance testing capacity of LTE-Advanced multi-mode chipsets, devices and base stations.
Anite, a global leader in wireless equipment testing technology, is pleased to announce that it has appointed James Bristow as global sales director of its handset testing business.
AT4 wireless has selected SAS, Anite’s interoperability and performance test solution, for advanced and rapid LTE device verification related to operator acceptance schemes.
Average peak throughputs as high as 144 Mbps were recorded in TeliaSonera’s commercial 4G network using Anite’s Nemo Outdoor test platform and a Cat 4 LTE test terminal Samsung Galaxy Note 3.
Anite, a global leader in wireless equipment testing technology, announced that it has launched full support for the Global Certification Forum (GCF) LTE data throughput performance testing requirements. This will enable mobile operators and device manufacturers to cost-efficiently test the data throughput performance of new devices in real-world conditions.