The new R&S RT-ZP1X passive 1:1 probe from Rohde & Schwarz broadens the application range of its R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscopes' front-end are extremely low noise, making this combination ideal for measuring the smallest of signals down to 1 mV/div, e.g., for power integrity measurements on integrated circuits and components.
The new R&S RTO-K44 option from Rohde & Schwarz offers powerful triggering and decoding functionality for debugging designs with MIPI M-PHY based protocols. Defined as a physical layer, M-PHY serves as the basis for a number of protocol standards that have been optimized for rapid data transmission in mobile devices.
Keysight Technologies Inc. announced a technological breakthrough for building the world’s highest-bandwidth oscilloscopes with the successful turn-on of chipsets that take advantage of Keysight’s leading edge Indium Phosphide (InP) semiconductor technology.
To keep engineers and scientists up to date with the latest developments in PC-based digitizer technology, Spectrum has published a handbook that covers the major product features of this powerful class of instrument and also explains when a digitizer can replace an oscilloscope. The 120-page booklet is printed in full color and includes a number of graphical images that highlight and explain key digitizer concepts and their application.
Rohde & Schwarz has expanded its range of trigger and decoder options for the R&S RTO and R&S RTE digital oscilloscopes. With the R&S RTx-K50, the oscilloscopes help users debug serial protocols that employ Manchester or NRZ coding.
Keysight Technologies Inc. introduced ISO CAN FD (controller area network with flexible data rate) decoding and triggering for its InfiniiVision 4000 and 3000T X-Series oscilloscopes. The new capabilities improve engineers' efficiency in debugging the ISO 11898-1 standard CAN FD, as well as the original non-ISO CAN FD protocol.
Keysight Technologies Inc. announced it will demonstrate the latest RF, microwave and mmWave design and measurement solutions for R&D, manufacturing and service at the IEEE MTT-S International Microwave Symposium, Booth 739, Phoenix, May 17-22.