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Articles Tagged with ''lvds''

RFMW offers new FastClock series of oscillators from Sunny Electronics

RFMW Ltd. announces design and sales support for Sunny Electronics' new lineup of crystal oscillators (XOs) and voltage controlled crystal oscillators (VCXOs). The new FastClock™ series uses a new, state-of-the-art, factory-configurable silicon technology that allows for a wide choice of frequency, voltage and output combinations. Offered in an industry standard 5 x 7 mm and 5 x 3.2 mm package, the FastClock series offers customers the ultimate flexibility with delivery of high performance XOs and VCXOs in as little as five days. The FastClock series targets multiple markets including RF, fiber channel, server and storage, wireless repeaters, transponders, data acquisition, military communications, SONET/SDH/DEWM/ATM, Ethernet, digital network switching, test equipment and industrial controllers.


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Linear's dual output sine wave to logic converter utilizes selectable input filtering for lowest additive jitter

Linear Technology Corp. introduces the LTC6957, a DC to 300 MHz dual output buffer/driver/logic translator, ideal for converting sine waves into low phase noise logic level signals. Prior solutions were unable to perform this conversion without introducing a significant amount of jitter.


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Multi-output clock buffer and divider delivers low jitter to optimize noise performance

RFIC Channel

Analog Devices Inc. introduced a clock buffer and divider IC that combines high-speed, extremely low jitter (41 fs across the 12-kHz to 20-MHz band) and selectable division capability.


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TI enters JESD204B market with dual, 16-bit ADC and clock jitter cleaner

MMICs&More

Texas Instruments Inc. introduced a pair of devices supporting the JEDEC JESD204B serial interface standard for data converters. 


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Linear introduces lowest noise, 16-Bit 20 Msps ADCs that achieve 84 dB SNR

Linear Technology Corp. introduces three low power 16-bit, 20Msps analog-to-digital converters (ADCs), the LTC2269, LTC2270 and LTC2271, offering the lowest input-referred noise and tight integral nonlinearity error (INL) for very high precision DC measurements. With only 46µVRMS input noise and maximum guaranteed INL error of ±2.3LSB, these ADCs are suitable for very low noise, high linearity sampling applications such as digital x-ray, infrared and medical imaging, pachymeters, spectrometry and cytometry.


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