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Articles Tagged with ''conformance''

Anritsu introduces industry’s first IMS emergency services test capability

Anritsu Co. announces it has developed the wireless industry’s first PTCRB-approved protocol test case for IMS Emergency Services. This critical test case is now available on the ME7834L Protocol Conformance Test (PCT) and Carrier Acceptance Test (CAT) system. Anritsu recently became the only supplier of approved test cases for this increasingly relevant technology during the PVG#64 meeting held in Beijing.


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7Layers upgrades Anritsu ME7873L RF/RRM conformance test system with CA and RRM test capabilities

7Layers and Anritsu Co. announce that 7Layers has upgraded its ME7873L RF/RRM conformance test system with Rel. 8, Rel. 9, and Rel. 10 Radio Resource Management (RRM), as well as carrier aggregation (CA) test capabilities. This upgrade significantly expands the 7Layers test portfolio, including RRM capabilities for conformance test (CT), carrier-specific RRM capabilities for carrier acceptance test (CAT), and Anritsu’s market-leading capabilities for LTE Advanced CA.


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PCTEST Lab selects R&S to expand its testing capabilities as 4G heats up

PCTEST Engineering Laboratory Inc. (PCTEST LAB), an accredited testing laboratory for wireless testing and certification, has purchased a second R&S TS8980FTA-2 conformance test system and several additional R&S CMW500 wideband radio communication testers to cover key next generation technologies. PCTEST's expanded test capabilities support new conformance and carrier acceptance test requirements for IMS, VoLTE, RCS, WiFi Offloading, E911 over IMS, SUPL 2.0, LTE A-GNSS, OTDOA, and eCID.


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Anite launches first full GCF LTE data throughput performance testing solution

Test & Measurement

Anite, a global leader in wireless equipment testing technology, announced that it has launched full support for the Global Certification Forum (GCF) LTE data throughput performance testing requirements. This will enable mobile operators and device manufacturers to cost-efficiently test the data throughput performance of new devices in real-world conditions.


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