Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test Systems for compound semiconductors, announces its participation in the upcoming ESREF Exhibition in Berlin, Germany. The ESREF conference will take place September 29 through October 2 at the Technische Universität Berlin (TUB).
The LTC3624 is a high efficiency, 17V input capable synchronous buck regulator from Linear Technology that delivers up to 2A of continuous output current to outputs as low as 0.6V. Synchronous rectification delivers efficiencies as high as 95% while Burst Mode® operation requires only 3.5µA of no load quiescent current.
Pickering Interfaces, a leading provider of modular signal switching and instrumentation for use in electronic test and simulation, is expanding its range of PCI switching solutions with the introduction of seven new PCI cards and expansion of an eighth card.
SemiGen Inc., an ISO and ITAR registered RF/Microwave assembly, automated PCB manufacturing, and RF Supply Center, offers PIN diodes that feature low capacitance and resistance, high reliability, and easy bonding with F.A.C. mesas.
Skyworks Solutions Inc., an innovator of high performance analog semiconductors enabling a broad range of end markets announced that it has unveiled its second-generation SkyOne™ platforms. SkyOne™ is a family of fully optimized, scalable devices that integrate all of the high-performance RF and analog content between the transceiver and antenna into the industry’s smallest footprint.
Richardson RFPD Inc. announces availability and full design support capabilities for three new 650 V non-punch-through (NPT) insulated-gate bipolar transistors (IGBTs) from Microsemi Corp. (Microsemi). The new devices are the latest addition to Microsemi's family of 45 A to 95 A IGBTs.
EADS North America Test and Services, a division of EADS North America Inc., introduces the Racal Instruments™1256L, LXI Switching System. The company’s switching systems are used to automate functional testing of a wide range of devices, resulting in improved performance for test time, repeatability, and signal fidelity.