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Articles Tagged with ''automated''
AWR Corp., the innovation leader in high-frequency EDA software, announces that it will sponsor the Best Paper Award at the upcoming as well as future Automated RF & Microwave Measurement Society (ARMMS) Conferences in memory of the late AWR European business development manager Steve Evans-Pughe. The ARMMS Best Paper Award titled as “Steve Evans-Pughe Award” will honor the memory of this UK and pan-European RF and microwave industry pioneer.
Indium Corp. introduces a new, high-reliability, low-voiding flux coating for solder preforms. LV1000 reduces false failures while increasing productivity, throughput yields, and component performance. This new halide-free (ROL0) material is especially suited for assembly processes in which the components don’t allow for proper outgassing of volatized flux.
ThinkRF announced that five of its employees have been recognized for their participation in this year’s IEEE AUTOTESTCON. AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.
Wainwright Instruments introduces UHF/microwave band reject filters that can be tuned by computer with intuitively usable software or directly by simple LAN Telnet protocol. The passband up to 2.5 or 5.0 GHz resp. makes these filters especially suitable for measuring harmonics in laboratory applications and automated test stations in production lines.
Fox Electronics, a leading global supplier of frequency control solutions and an IDT company, now offers the FTM Series of surface mount OCXOs that is ideally suited as the timing reference for network synchronization.
New high-end test platform from Rohde & Schwarz offers all-in-one solution for testing broadcast equipment
The new R&S BTC broadcast test center from Rohde & Schwarz provides a complete testing environment for nearly all audio, video and multimedia applications – in a single device. The RF reference signal generator generates RF signals for all global TV and broadcasting standards and simulates transmissions. The generator can also internally analyze the audio/video functions of DUTs in realtime. The modular design provides a high degree of scalability, allowing the R&S BTC to be configured for any customer requirement.
Sonoscan announces its enhanced Digital Image Analysis Toolbox™ used for automated acoustic analysis of individual IC components, various types of bonded wafers including MEMS devices, and other devices.
Keithley Instruments Inc. announces enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high power semiconductor characterization solutions.
Azimuth Systems Inc., a provider of automated, real-world mobile performance test solutions, introduced new Device Performance Test Plans. Designed for all phases of device development, including interoperability testing, and pre and post launch testing, Azimuth test plans offer a proven method for operators and OEMs to maximize the ROI from test tools.
Agilent Technologies Inc. introduced compliance testing support for Energy-Efficient Ethernet (EEE) standards used in networking applications. Agilent’s solution for transmitter tests includes 10BASE-T, 100BASE-T and 1000BASE-T EEE test standards as described in the IEEE 802.3az-2010 specification.