AWT Global’s new ATC series low PIM anechoic chambers are designed for measuring antennas from 700 to 6000 MHz. Besides the high shielding coefficient of more than 90 dB, ATC series antenna test chambers generate lowest residual passive intermodulation (PIM). The combination of chamber geometry, specifically designed pyramidal electromagnetic absorbing material and innovative manufacturing techniques result in remarkable characteristics.
The industry-accepted testing paradigm is under stress to accommodate an explosion of new test cases without corresponding increases in budget or time to market. At CTIA 2013, Azimuth unveiled solutions for a new testing paradigm.
Nujira Ltd., the world’s leader in Envelope Tracking (ET) technology, has signed a partnership agreement with LTX-Credence Corp., a global provider of market focused, cost-optimized semiconductor test solutions. The agreement will see Nujira use the LTX-Credence Diamond10 tester for testing of its Coolteq.L High Accuracy Tracking ET modulator ICs ahead of full volume production later this year.
Agilent Technologies Inc. announced enhancements to its N5973A Interactive Functional Test Automation for Verizon Wireless Compliance Test Plans software, including new scripts to automate Verizon's IMS voice-over-IP compliance test plan.
Rohde & Schwarz launched the R&S SMW200A high-end vector signal generator that combines maximum flexibility, outstanding performance and intuitive operation, making it the ideal tool for generating complex, digitally modulated signals.
The MADL waveform developed by Northrop Grumman was successfully demonstrated in a Lockheed Martin F-35 Lightning II joint strike fighter program flight test, validating an eight-year development effort to advance communication among fifth-generation aircraft.