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Articles Tagged with ''test''

Anritsu Enhances Cell Master™ and Spectrum Master™ To Better Meet LTE Field Test Requirements

January 17, 2012

Anritsu Company introduces enhanced MT8212E/MT8213E Cell Master™ and MS2712E/MS2713E Spectrum Master™ handheld analyzers that have new measurement capabilities and improved overall performance to address the rollout of 4G technologies, including TD-LTE. Offering superior performance in a compact design, the MT8212E/MT8213E and MS2712E/MS2713E offer service providers, network equipment manufacturers (NEMs), and third-party contractors and installers a cost-efficient and accurate test tool when deploying and maintaining LTE networks.


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Agilent delivers high-speed inter-chip compliance test software

January 11, 2012

Agilent Technologies Inc. announced the release of the first commercially available High-Speed Inter-Chip (HSIC) compliance test software for real-time oscilloscopes. The software automatically tests HSIC signals according to HSIC specifications.


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NXP to use Agilent electronic test products at Consumer Electronics Show

January 11, 2012

Agilent Technologies Inc. announced that its electronic test equipment will be used by NXP Semiconductors N.V. in a demonstration of its beam-forming technology for the next generation of communication and radar products at the International Consumer Electronics Show in Las Vegas, Jan. 10-13.


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Anritsu and EMITE partner to deliver MIMO OTA LTE test solutions

January 11, 2012

Anritsu Corp. and EMITE have announced that the Anritsu MT8820C One-Box Tester has been selected by EMITE as a supported test solution for MIMO OTA LTE compliance testing.


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