Articles Tagged with ''test''

Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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Tektronix acquires Picosecond Pulse Labs

Tektronix Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced the acquisition of Picosecond Pulse Labs. The move is intended to strengthen the Tektronix portfolio in the growing market for test equipment to support 100G/400G optical data communications research and development. The terms of the transaction were not disclosed.  


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AWR to preview AWR Design Environment V11 at RWW 2014

AWR Corp., the innovation leader in high-frequency EDA software, will preview in Booth #1 new features and enhancements in its soon-to-be-released AWR Design Environment™ V11 at Radio Wireless Week 2014 (RWW 2014) in Newport Beach, CA from January 20 to 21. Of special interest are demos of the new configurable PCells (library of parts) antenna measurement capabilities in AWR’s Analyst™ 3D finite element method (FEM) EM simulation software.


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Fifth Lockheed Martin MUOS secure comm satellite completes assembly, enters system test

The fifth Lockheed Martin Mobile User Objective System (MUOS) satellite for the U.S. Navy is entering its first system test faster than the previous build, now that integration is complete. Engineers and technicians recently mated its system module and core to the multi-beam assembly (MBA), which hosts 16 ultra-high frequency (UHF) antennas for distributed, global communications coverage.


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