Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.
SenarioTek announced the extension of the FlexMatrix reconfigurable RF switch matrix series to incorporate external signal conditioning. Now test engineers can easily route their required signal conditioning into RF switching paths for applications such as radar, military communications and consumer wireless.
Agilent Technologies Inc. announced a new protocol testing solution for MIPITM Alliance Gear2 DigRf v4 RFICs. The Agilent M9252A DigRF host adapter allows developers to speed testing and analysis of RFICs used in cellular phones, tablets and other mobile devices.
National Instruments announced 10 pieces of new application IP that enable engineers and scientists to use NI LabVIEW system design software to build their own custom RF instruments. This IP integrates with PXI FPGA targets such as the NI PXIe-5644R VST and extends their default capabilities.
Rohde & Schwarz performs together with ASTRI a live test on a 2x2 MIMO base station in the uplink and downlink at the Mobile World Congress 2013. Hong Kong Applied Science and Technology Research Institute (ASTRI) provides an LTE-Advanced small cell as the device under test. What makes this demonstration special is that the 2x2 MIMO signal is generated and analyzed using only a single measuring instrument each.
Pasternack Enterprises Inc., an ISO 9001:2008 manufacturer and global supplier of RF and microwave products, expands inventory of in-series and between-series SMP and Mini SMP adapters for millimeter wave applications.
Anite, a global leader in wireless testing technology, announced that, by working in close collaboration with leading chipset manufacturers, it has achieved peak data rates with commercial devices for LTE-Advanced (LTE-A) carrier aggregation.
Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.
Anritsu Co. will be publicly demonstrating its new MW82119A PIM Master for the first time at NATE 2013 in Fort Worth, TX, February 18-21. In addition to the MW82119A, which is the industry’s first high-power, battery-operated, portable PIM test analyzer, Anritsu will be displaying its Site Master™ handheld cable and antenna analyzers, and Network Master™ MT9090 optical test platform in its NATE booth (#100).