Articles Tagged with ''test''

AMETEK Inc. has acquired VTI Instruments, a leading manufacturer of high-precision test and measurement instrumentation, for $74 million.  VTI, acquired from an investor group led by Merit Capital Partners and Alerion Capital Group, has annual sales of approximately $38 million. 

Aeroflex Holding Corp., a leading global provider of high performance microelectronic components, and test and measurement equipment, announced the acquisition of Shenick Network Systems (“Shenick”), a leading edge provider of virtual testing for next generation software defined networking.

UBM Tech, the daily source of essential business and technical information for decision makers in the electronics industry, held its annual DesignCon conference and expo last week in Santa Clara, CA.  Met with enthusiastic industry reception, DesignCon 2014 was attended by more than 5,000 members of the chip, package, board and systems design communities.

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp., announced that the latest upgrade to its Lector software provides dramatic improvements in the speed of mobile device RF tests in service centers.

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp., has launched an extended version of its TM500 industry-standard base station tester capable of emulating several thousand LTE user equipments (UE), fading channel models, and LTE-A carrier aggregation functionality in a one-box benchtop unit. The TM500 Test Mobile delivers more leading edge LTE-A development capability with a higher UE density than any other solution on the market.

National Instruments announced that it is the first vendor to execute a Manufacturing Test License (MTL) agreement with Broadcom Corp. The MTL agreement authorizes NI to provide manufacturing test solutions and modifiable application source code to Broadcom® wireless LAN and Bluetooth device customers.

Agilent Technologies Inc. announced theE5063A ENA Series network analyzer, a low-cost ENA solution for manufacturing test. The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.

National Instruments released NI Trend Watch 2014, which summarizes the latest technology trends to help engineers meet evolving demands and integrate the ever-increasing power of technology into their work. The inaugural report examines a range of topics — from cyber-physical systems to the “SDR-ification” of RF instruments.

Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.