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Articles Tagged with ''test''

Anite delivers significant LTE-Advanced industry contribution

Anite, a global leader in wireless equipment testing technology, announced that it has further demonstrated its protocol test case leadership with the first LTE-Advanced (LTE-A) carrier aggregation (CA) test case verification submissions to RAN5. These submissions were based on initial verifications originally submitted by Anite to RAN5 in April of 2013. This key achievement is a stepping stone toward validation, leading to the inclusion of these test cases in both GCF and PTCRB device certification requirements.


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Rohde & Schwarz video testers now support testing for ultra-HD consumer electronics equipment

Manufacturers and test houses can now use the R&S VTC and R&S VTE video testers from Rohde & Schwarz to test next-generation HDMI sink devices with ultra-HD or 4k screen resolution. This is possible thanks to the new R&S VT-B360 HDMI TX 300 MHz HDMI module, which is equipped with four parallel HDMI channels with ultra-HD resolution. Tests can be performed on TVs, monitors, projectors and A/V receivers with conventional screen resolutions as well.   


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Anritsu to showcase test solutions that address high-frequency designs at IMS 2013

Anritsu Co. (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.  


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Re-defining device characterization test as Mesuro launches ‘rapid load pull solution’

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.


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