Articles Tagged with ''test''

Anritsu extends LTE-Advanced carrier aggregation conformance test leadership

Anritsu Co. announces its market-leading ME7873L RF/RRM Conformance Test System and ME7834L Mobile Device Test Platform have received the most test case validations across a single platform type for LTE-Advanced Carrier Aggregation (CA). This breakthrough further affirms Anritsu’s commitment to provide solutions for certification testing of mobile devices that implement CA, one of the key LTE-Advanced features defined in 3GPP Release 10.


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VTI partners with Maya HTT to substantially upgrade "Test for I-DEAS"

VTI Instruments is pleased to announce VTI's partnership with Maya HTT for the newly upgraded Test for I-DEAS. This partnership provides customers a new and improved experience with the most comprehensive solutions for noise and vibration testing in the industry. With support for VTI Instruments' new EMX Dynamic Signal Analyzer products, Test for I-DEAS offers engineers a complete hardware and software environment with seamless integration between test domains for efficient and accurate large scale dynamic testing. 


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Anritsu intros PIM Master options for key LTE and UMTS bands testing

Test & Measurement

Anritsu Co. introduces three frequency options for its industry-leading PIM Master MW82119A Passive Intermodulation (PIM) high-power, battery-operated, portable PIM test analyzer. The new options provide wireless field engineers and technicians with the first battery-operated handheld analyzers that can accurately conduct “top of the tower” PIM measurements in the LTE 800 MHz and UMTS 2100 MHz bands, in addition to the LTE 2600 MHz band.


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Anritsu PIM Master earns innovation award from Frost & Sullivan

Test & Measurement

Anritsu Co. announces that its PIM Master MW82119A has earned the Frost & Sullivan 2013 Global New Product Innovation Award for PIM Test Equipment. In presenting Anritsu with the award, Frost & Sullivan stated, “the PIM Master MW82119A demonstrates Anritsu’s commitment towards delivering higher value to users of portable PIM test equipment while addressing evolving technological trends in the PIM testing market.”


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ThinkRF receives award for best paper at IEEE AUTOTESTCON 2013

ThinkRF announced that five of its employees have been recognized for their participation in this year’s IEEE AUTOTESTCON. AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.


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