Horizon House Publications and Microwave Journal China announced that National Instruments (NI) and its fully-owned subsidiary AWR Corp. will be the corporate sponsors of the Electronic Design Innovation Conference (EDI CON) 2014 in Beijing, China April 8-10, 2014.
Anritsu Co. announces that its PIM Master MW82119A has earned the Frost & Sullivan 2013 Global New Product Innovation Award for PIM Test Equipment. In presenting Anritsu with the award, Frost & Sullivan stated, “the PIM Master MW82119A demonstrates Anritsu’s commitment towards delivering higher value to users of portable PIM test equipment while addressing evolving technological trends in the PIM testing market.”
ThinkRF announced that five of its employees have been recognized for their participation in this year’s IEEE AUTOTESTCON. AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.
In a first-of-its-kind test for Raytheon Co.'s Accelerated Improved Intercept Initiative system, AI3 destroyed an unmanned aerial system (UAS) in flight. The intercept was part of the second guided test flights for the AI3 program and follows its first in-flight defeat of a 107mm rocket earlier in the test series.
The R&S TS8980FTA-2 and R&S CMW500 platforms from Rohde & Schwarz will expand the overall test capabilities of PCTEST Lab, boost its ability to offer the complete range of wireless test services needed for global certification, and make certification testing more efficient for customers.
EMITE has included the R&S CMW500 Wideband Radio Communication Tester from Rohde & Schwarz as a supported test solution for MIMO OTA testing. The R&S CMW500 is now fully integrated into the EMITE MIMO Graphic User Interface test software, and has been successfully demonstrated to customers worldwide.
Agilent Technologies Inc. announced it will demonstrate a wide range of new high-performance, flexible test solutions for designing and testing components for radar systems, antennas and next-generation wireless devices at European Microwave Week (Booth 105) Oct. 6-11 at the Nürnberg Convention Center in Nuremberg, Germany.
If you are assessing the power conversion efficiency of your power amplifiers, you are probably making power-added efficiency (PAE) measurements. Most PAE test setups use multiple instruments – such as RF power meters, digital oscilloscopes and DC power analyzers – to calculate RF voltage and current measurements.