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Articles Tagged with ''test''

Agilent introduces industry's lowest-priced USB 2.0 signal-quality test option

Agilent Technologies Inc. introduced the industry’s lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications.


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Agilent introduces enhanced solution for PCI Express 3.0 receiver characterization

Agilent Technologies Inc. announced an enhanced solution for PCI Express® 3.0 receiver characterization at DesignCon.


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Wavefront and Anritsu to offer the first LTE/WCDMA pre-screen testing in Canada

Wavefront, Canada’s Centre of Excellence for wireless commercialization and research, and Anritsu Electronics Ltd., a leader in wireless test solutions, announce they have formed a partnership expected to lower the costs and increase the availability of long term evolution (LTE) development and testing in Canada for small and medium enterprise (SME) level businesses, device manufacturers, and mobile virtual network operators (MVNO). 


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Agilent unveils waveform generator support for HDMI and MHL sink tests

Agilent Technologies Inc. announced support for the High-Definition Multimedia Interface (HDMI) and Mobile High-Definition Link (MHL) sink tests through its M8190A arbitrary waveform generator and enhanced N5990A test-automation software.


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Pronghorn Solutions introduces family of systems test synthesizer solutions

Pronghorn Solutions, a low cost high performance instrument company announces the PHS – 5000 family of fast tuning USB controlled microwave frequency synthesizers.


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Agilent introduces benchtop digital multimeter designed to turbocharge electronic T&M applications

Agilent Technologies Inc. announced the 34450A 5½ digit Benchtop Digital Multimeter, designed to turbocharge electronic test and measurement applications for industrial and educational use.


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Agilent to demonstrate newest high-speed digital design and test solutions at DesignCon

Agilent Technologies Inc. announced it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).


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EDI CON unveils new exhibitors presenting high-frequency connectivity products

EDI CON organizers have announced six new exhibitors for the show, which is taking place this March 12-14 in Beijing, China. Azimuth Systems, Microwave Vision Group, Times Microwave, Insulated Wire (IW), Southwest Microwave and Tower/Jazz join the list of exhibitors and speakers at this industry-driven high-frequency electronics event.


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NI releases Automated Test Outlook 2013 highlighting industry's latest trends

National Instruments released its Automated Test Outlook 2013 highlighting the company’s research into the latest test and measurement technologies and methodologies. The report examines trends affecting a variety of industries. 


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Rohde & Schwarz to present enhanced oscilloscopes at embedded world 2013

New bandwidths, mixed-signal analysis and options for testing USB interfaces, CAN LIN buses and audio signals: Rohde & Schwarz significantly expanded its oscilloscope portfolio in 2012. At the embedded world 2013 trade fair in Nuremberg (hall 4, booth 112), the company will present its latest applications, two new probes and other state-of-the-art products.


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