advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Articles Tagged with ''test''

Rohde & Schwarz puts its microwave expertise to the test at EuMW 2012

September 20, 2012

At European Microwave Week in Amsterdam (hall 3, booths 115/216), Rohde & Schwarz will present highlights from its test and measurement products for microwave applications. In addition, experts from Rohde & Schwarz will impart their expertise to attendees of nine workshops and seminars covering various microwave applications.  


Read More

Kaelus introduces LTE 800 ‐ passive intermodulation test equipment

TestBench
September 20, 2012

Kaelus iQA0-1 PIM AnalyzerKaelus announces the availability of LTE 800 test capability in both its Portable and Bench Passive Intermodulation (PIM) Test Equipment. 


Read More

Agilent to launch seminar tour focused on principles of system design for automated testing

September 17, 2012

Agilent Technologies Inc. announced it will launch a seminar tour on system design principles, including on-site demonstrations, case studies and expert insight into how to develop high-capacity and high-performance electronic test systems. At these complimentary full-day technical seminars, Agilent experts and leading system integrators will cover the latest technologies for automated instrumentation in a broad set of industries.


Read More

Agilent and CATR (TMC) to collaborate on TD-LTE MIMO

September 14, 2012

Agilent Technologies Inc. announced a memorandum of understanding has been signed with the China Academy of Telecommunication Research (Telecommunication Metrology Center), or CATR (TMC). The two organizations have agreed to work together on TD-LTE MIMO over-the-air (OTA) test research.


Read More

Agilent to showcase high-performance 32 Gb/s bit error ratio tester at ECOC

September 13, 2012

Agilent Technologies Inc. announced it will demonstrate a 32-Gb/s bit error ratio tester at ECOC (Amsterdam RAI, Hall 1, Stand 712) in Amsterdam, Sept. 17-19.


Read More

Aeroflex expands synthetic instrument leadership with integrated test system

TestBench
September 11, 2012

Aeroflex 7700Aeroflex Inc. announced the availability of the 7700 integrated microwave test system, a bench-sized instrument that utilizes Aeroflex’s synthetic architecture and Common Platform hardware to achieve fast measurement throughput.


Read More

Reverb Networks awarded patent for SON-based interference detection

September 6, 2012

Reverb Networks, a leading developer of intelligent Self-Optimizing Network (SON) solutions designed to provide mobile network operators with improved operational and spectral efficiencies, announced that it has received a patent award from the U.S. Patent and Trademark Office for automated interference detection techniques using measurements from mobile devices, a key component of SON-based network optimization for UMTS and LTE wireless networks.


Read More

Agilent introduces world’s fastest PXI vector signal generator

TestBench
September 5, 2012

Agilent M9381AAgilent Technologies Inc. introduced the world’s fastest vector signal generator in a PXI form factor. The Agilent M9381A is a 1-MHz to 3- or 6-GHz VSG that combines fast switching and excellent RF parametric performance.


Read More

AWR Design Forum (ADF) 2012 tours Europe this autumn

September 5, 2012

AWR Corp. is taking its very successful AWR Design Forum to numerous cities throughout Europe starting on the 11th of September in the United Kingdom (UK) and concluding on the 29th of November in France.  A complete listing of ADF locations and agenda details, as well as registration information, is available online at www.awrdesignforum.com.


Read More

CMRI collaborates with Aeroflex for TD-LTE network testing

TestBench
August 30, 2012

Aeroflex tm500ueAeroflex Ltd. and China Mobile Research Institute (CMRI) announced that the Memorandum of Understanding has been signed between CMRI and Aeroflex for a co-operation covering both LTE and LTE-A technologies.


Read More

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement