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Articles Tagged with ''test''

Clean up your test bench with a little help from Vaunix’s Lab Bricks at IMS 2013

Vaunix Technology Corp., (www.vaunix.com), a manufacturer of USB controlled and powered test equipment, is pleased to announce they’ll be displaying their latest models of USB powered Lab Bricks at the International Microwave Symposium (IMS) in Seattle, WA June 4-6th in booth #2042.  


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Anritsu to showcase test solutions that address high-frequency designs at IMS 2013

Anritsu Co. (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.  


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Re-defining device characterization test as Mesuro launches ‘rapid load pull solution’

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.


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Mesuro launches Rapid Load Pull test solution

Mesuro has launched a new test solution that utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments.


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Rohde & Schwarz and 7Layers verify test method to determine ECC of MIMO LTE devices

Rohde & Schwarzand 7Layers have verified and validated the Synchronized test approach to determine the Envelope Correlation Coefficient, which characterizes the antenna subsystem of MIMO LTE devices.


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MiCOM Labs introduces MiTest, the first cloud based modular test system

MiCOM Labs Inc., has released MiTest, a hardware and cloud based computing test system that can accelerate product development release by running regulatory compliance testing in a company’s own design lab.  “MiTest provides manufacturers the ability to consolidate company-wide test processes, enabling flexible in-house compliance testing and certification possibilities for new products,” said Gordon Hurst, president and CEO for MiCOM Labs.


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R&S OTA test system enables 3rd party test lab to perform 802.11n WLAN OTA measurements

Test & Measurement

CETECOM has selected Rohde & Schwarz (R&S) to enhance their OTA testing capabilities with a new test system that includes LTE multiple-input, multiple-output (MIMO) and 802.11n functionality. The TS8991 test system can perform OTA measurements for LTE MIMO in addition to all cellular 2G, 3G, and 4G technology standards.


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Northrop Grumman, U.S. Navy complete Triton unmanned aircraft's first flight

Aerospace & Defense

The Northrop Grumman Corp.-built MQ-4C Triton high-altitude unmanned aircraft successfully completed its first flight today from the company's manufacturing facility in Palmdale.


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Vaunix announces 4 to 8 GHz phase shifter, provides excellent phase accuracy

Vaunix Technology Corp., (www.vaunix.com), a manufacturer of USB controlled and powered test equipment, is excited to announce the addition of their new Lab Brick Phase Shifter, the LPS-802. The new product has a frequency of 4-8 GHz and provides excellent phase accuracy while offering one-degree phase resolution.


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Teseq introduces CBA 400M-260 broadband amplifier

Teseq has expanded its broadband amplifier line to include a Class A linear and low distortion model that operates from 10 kHz to 400 MHz with a rated power level of 260 W.


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