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Articles Tagged with ''test''

Rohde & Schwarz enables comprehensive automotive radar tests and signal analysis

When developing radar sensor chipsets, users can now use the new Rohde & Schwarz solution to simulate a realistic scenario in the lab. For example, it is possible to simulate vehicles with different moving profiles or stress tests in different environments. As a result, developers can verify the signal processing algorithms of the sensor at an early stage. 


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AR and MVG sign MoA to provide turnkey solutions

Microwave Vision Group and Amplifier Research have signed a memorandum of agreement that will provide customers with a greater choice of quality EMC and Antenna Measurement turnkey solutions based on their combined expertise and product portfolio.


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Rohde & Schwarz presents mmWave test setup at 5G Global Summit in South Korea

At the 5G Global Summit, held in Busan, South Korea, Rohde & Schwarz presented an extremely compact test setup for generating and analyzing signals up to 67 GHz that will enables users to evaluate potential new physical air interface technologies for future 5G networks.


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Keysight to demonstrate new InfiniiVision oscilloscope options at Automotive Expo

Keysight Technologies Inc. announced it will demonstrate solutions that improve automotive engineers' efficiency in debugging controller area network with flexible data-rate (CAN FD) and single-edge nibble transmission (SENT) serial buses at the Automotive Testing Expo, Suburban Collection Showplace, Booth 12024, Novi, Michigan, Oct. 28-30. 


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Chenakin appointed R&D director of Anritsu microwave measurement division

 Anritsu Co. announces the appointment of Dr. Alexander Chenakin as director of R&D for the Anritsu Microwave Measurement Division (MMD). A renowned expert in the test and measurement industry who holds multiple patents and has earned numerous awards, Dr. Chenakin will oversee the Anritsu R&D team responsible for developing the company’s next-generation synthesized source product line. 


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Mesuro and NI demo load pull set up using RAPID PXI digital tuner

Mesuro Ltd., with support from National Instruments, announced its latest advance in the utilization of PXI to improve the speed of test for today’s technical demand. At European Microwave Week the two organizations demonstrated a load pull set up that uses a traditional passive tuner for fundamental tuning and adds the RAPID PXI digital tuner to provide a high speed harmonic tuning capability. 


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Anite acquires Xceed Technologies

 Anite, a global leader in wireless network testing technology, announced the acquisition of Xceed Technologies Inc., to meet the growing market requirements for data analysis and post-processing and to further expand its network testing product portfolio.  


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NI UK & Ireland announce 2014 engineering impact award finalists

National Instruments has announced the shortlisted finalists in the 2014 Engineering Impact Awards, to honour the UK & Ireland’s most innovative engineering projects using NI software and hardware.


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Keysight's UXM wireless test set expands functional test capabilities

 Keysight Technologies, Inc. announced new functionality enhancements to the E7515A UXM wireless test set including support for LTE-A category 7 data throughput, expanded functional test capabilities, and in-depth RF performance verification using the industry standard X-Series measurement applications. 


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Accel-RF Instruments Corp. to exhibit at ESREF in Berlin, Germany

 Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test Systems for compound semiconductors, announces its participation in the upcoming ESREF Exhibition in Berlin, Germany. The ESREF conference will take place September 29 through October 2 at the Technische Universität Berlin (TUB). 


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