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Articles Tagged with ''test''

Aeroflex significantly reduces LTE mobile test times for service centers

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp., announced that the latest upgrade to its Lector software provides dramatic improvements in the speed of mobile device RF tests in service centers.


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Aeroflex introduces one-box LTE-A base station tester

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp., has launched an extended version of its TM500 industry-standard base station tester capable of emulating several thousand LTE user equipments (UE), fading channel models, and LTE-A carrier aggregation functionality in a one-box benchtop unit. The TM500 Test Mobile delivers more leading edge LTE-A development capability with a higher UE density than any other solution on the market.


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National Instruments announces licensing agreement with Broadcom

National Instruments announced that it is the first vendor to execute a Manufacturing Test License (MTL) agreement with Broadcom Corp. The MTL agreement authorizes NI to provide manufacturing test solutions and modifiable application source code to Broadcom® wireless LAN and Bluetooth device customers.


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Agilent announces ENA Series network analyzer that reduces cost, optimizes test of RF components

Agilent Technologies Inc. announced theE5063A ENA Series network analyzer, a low-cost ENA solution for manufacturing test. The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.


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NI Trend Watch 2014 highlights technological breakthroughs

National Instruments released NI Trend Watch 2014, which summarizes the latest technology trends to help engineers meet evolving demands and integrate the ever-increasing power of technology into their work. The inaugural report examines a range of topics — from cyber-physical systems to the “SDR-ification” of RF instruments.


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Agilent installs atomic force microscope at Cambridge Graphene Centre

Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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AWT Global introduces new TETRA PIM Analyzer

AWT Global has launched a new PIM analyzer for TETRA and UHF frequencies: The S1L TETRA MK2 Series. The new PIM analyzers are designed for measuring TETRA and UHF networks in the 400 MHz frequency range.


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Chalmers University selects Anritsu ME7838A vector network analyzer

Chalmers University has selected Anrtisu’s ME7838A broadband mm-wave test system to provide measurements supporting the development of new, high-frequency devices and components.


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