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Articles Tagged with ''test''

Agilent announces ENA Series network analyzer that reduces cost, optimizes test of RF components

Agilent Technologies Inc. announced theE5063A ENA Series network analyzer, a low-cost ENA solution for manufacturing test. The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.


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NI Trend Watch 2014 highlights technological breakthroughs

National Instruments released NI Trend Watch 2014, which summarizes the latest technology trends to help engineers meet evolving demands and integrate the ever-increasing power of technology into their work. The inaugural report examines a range of topics — from cyber-physical systems to the “SDR-ification” of RF instruments.


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Agilent installs atomic force microscope at Cambridge Graphene Centre

Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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AWT Global introduces new TETRA PIM Analyzer

AWT Global has launched a new PIM analyzer for TETRA and UHF frequencies: The S1L TETRA MK2 Series. The new PIM analyzers are designed for measuring TETRA and UHF networks in the 400 MHz frequency range.


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Chalmers University selects Anritsu ME7838A vector network analyzer

Chalmers University has selected Anrtisu’s ME7838A broadband mm-wave test system to provide measurements supporting the development of new, high-frequency devices and components.


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Tektronix acquires Picosecond Pulse Labs

Tektronix Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced the acquisition of Picosecond Pulse Labs. The move is intended to strengthen the Tektronix portfolio in the growing market for test equipment to support 100G/400G optical data communications research and development. The terms of the transaction were not disclosed.  


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AWR to preview AWR Design Environment V11 at RWW 2014

AWR Corp., the innovation leader in high-frequency EDA software, will preview in Booth #1 new features and enhancements in its soon-to-be-released AWR Design Environment™ V11 at Radio Wireless Week 2014 (RWW 2014) in Newport Beach, CA from January 20 to 21. Of special interest are demos of the new configurable PCells (library of parts) antenna measurement capabilities in AWR’s Analyst™ 3D finite element method (FEM) EM simulation software.


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Lockheed Martin completes milestone to upgrade the Navy's EW defenses

Aerospace & Defense

Lockheed Martin recently completed a milestone test on the U.S. Navy’s evolutionary Surface Electronic Warfare Improvement Program (SEWIP) Block 2 system. This test further validated the system’s ability to protect the Navy’s fleet from evolving anti-ship missile threats.


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