Articles Tagged with ''test''

Anritsu to highlight high-speed design test leadership position at DesignCon 2016

Anritsu Co. (booth #717) will highlight its leadership position in high-speed digital test – displaying the industry’s only solution that supports 112G PAM4 generation and BER tests with accurate jitter injection – at DesignCon 2016. The new solution, which features the award-winning MP1800A BERT Signal Quality Analyzer (SQA) and new 64G baud 2-bit DAC with MUX, is part of a portfolio of test solutions and technologies that Anritsu will showcase to help engineers verify high-speed chip, board, and system designs used for emerging networks.


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