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Articles Tagged with ''test''

National Instruments UK & Ireland hosts Automated Test Summit 2014

National Instruments UK & Irelandwill host industry experts and test professionals at the Automated Test Summit 2014 on 19th June at the Madejski Stadium, Reading, UK. The event will allow delegates to learn about the top trends and technologies influencing automated test through informative presentations, technical discussions and ten hours of hands-on training.


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Rohde & Schwarz invests in global hub in Singapore

Rohde & Schwarz has inaugurated its new “Das Spektrum” building in the Changi Business Park in Singapore. This global hub is a platform for research, development, production, global sourcing and supply chain management in areas of test and measurement, broadcasting, secure communications, and radiomonitoring and radiolocation,


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Raytheon tests new guidance system for Tomahawk cruise missile

Raytheon Co. successfully completed a passive seeker test designed for a Tomahawk Block IV cruise missile using company-funded independent research and development investment. The captive flight test, using a modified Tomahawk Block IV missile nose cone, demonstrated that Raytheon's advanced, next-generation; multi-function processor can enable the cruise missile to navigate to and track moving targets emitting radio frequency signals. 


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Aeroflex LTE-A test systems add support for aggregation of three component carriers

Aeroflex Limited, a wholly owned subsidiary of Aeroflex Holding Corp., announced today that the TM500 LTE-A Test Mobile and the E500 Capacity Test System now both support the aggregation of three component carriers (3 CC). Carrier aggregation of 3 CC allows mobile network operators to achieve data rates of up to 450 Mbit/s on their LTE-A networks.
 


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Broadband System: VectorStar™ ME7838D

VectorStar ME7838DAnritsu Co. establishes a new standard in broadband performance with the introduction of the VectorStar™ ME7838D broadband system that provides industry-best frequency coverage of 70 kHz to 145 GHz in a single sweep using a coaxial test port. The VectorStar ME7838D gives design engineers greater confidence when performing on-wafer device characterization at 70 GHz and beyond.


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