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Industry News / Test and Measurement

Tektronix Expands Logic Analyzer Family with Mid-range Offering

September 8, 2010
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Tektronix Inc., a provider of test, measurement and monitoring instrumentation, announced the TLA6000 Series, a logic analyzer that brings powerful high-end debug and analysis to mainstream embedded systems designers. The TLA6000 Series delivers performance and functional capability previously only found on the high-performance TLA7000 Series of instruments at a much lower price point, while offering more capabilities than the portable TLA5000 Series models.

Higher signal speeds and increased board densities often lead to signal integrity issues such as crosstalk, ground bounce, and ringing that manifest themselves in functional failures of the digital system. The TLA6000 Series gives engineers a complete toolset to help them quickly find, isolate, and debug these hard-to-isolate issues.

“With the TLA6000 Series we are expanding our logic analyzer portfolio and in the process delivering the industry’s most complete tool for resolving complex signal integrity issues,” said Dave Farrell, Director, Logic Analyzer Product Line, Tektronix. “Among the rich set of capabilities are a comprehensive suite of signal integrity tools, superior performance and ease-of-use with features like drag and drop triggering, coupled with advanced analysis tools for digital system applications such as FPGAs, DDR and MIPI.”

Intended to meet the growing demand for more performance among embedded engineers, the TLA6000 Series is available in 68, 102 and 136 digital channel configurations with 125 ps high speed timing on all channels, up to 450 MHz state timing and up to 128 Mb record length. This level of performance represents a significant price-performance breakthrough.

The TLA6000 Series enhances engineering productivity with advanced features like iCapture™ multiplexing that eliminates double probing with simultaneous digital and analog acquisition through a single logic analyzer probe. Glitch trigger and storage allows users to trigger on and display observed signal integrity faults, while the iView™ display provides a useful time-correlated view of both logic analyzer and oscilloscope data on the same display. Simple and intuitive instrument setup saves time in busy lab environments with accelerated design cycles.

The TLA6000 Series is well suited for a broad range of debug and analysis applications, including signal integrity analysis, FPGA debug and verification, MIPI protocol analysis, memory system validation, and embedded software integration and debug.


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