Anritsu Co. introduces the MF6900A fading simulator for use with its MD8430A Signalling Tester, which creates a single vendor solution for conducting simulation tests that have traditionally required more expensive, multi-vendor configurations. The integrated test solution allows developers and manufacturers of 3GPP LTE terminals and chipsets to perform highly accurate and repeatable 2x2 MIMO fading tests more efficiently.
When connected to a MD8430A Signalling Tester, the MF6900A emulates the operation of a 3GPP LTE base station in a 2x2 MIMO fading environment. It tests and verifies the handover operation by simulating fading when a mobile terminal (UE) switches its connection between two base station cells. The MD8430A/MF6900A can perform all the necessary intra-LTE handover tests. Utilizing Anritsu’s existing MD8480C UMTS/GSM Signalling Tester, inter-RAT handovers between LTE and UTRAN/GERAN can be made.
In addition to cutting test cost in half, the MD8430A/MF6900A configuration improves repeatability and accuracy. Conventional test configurations use RF cables to connect the fading simulators and base station simulator, which requires signal loss adjustments for each channel. The MD8430A/MF6900A processes signals in a digital baseband to generate fading simulations with high reproducibility.