Industry News Test and Measurement Channel

Tektronix Showcases Enhanced Portfolio of New Products

Tektronix Inc., a provider of test, measurement and monitoring instrumentation, will feature an extensive range of new and enhanced products and solutions at the 2009 International Microwave Symposium (IMS), June 7-12, in booth #2624. Tektronix will showcase solutions across its portfolio, including radio communications, spectrum management, radar, electronic warfare, and amplifier device characterization and ultra-wideband applications.

Today's RF/microwave world is merging the digital computing and traditional analog RF technologies. This integration of digital and analog RF is presenting engineers with a new highly complex environment, necessitating a new generation of RF/microwave test tools. Tektronix delivers the signal generation and analysis capabilities required to overcome the most challenging microwave and RF design challenges with confidence.

Reinventing the Spectrum Analyzer with Second Generation DPX® Spectrum Technology

The recently introduced Option 200, for the RSA6000 Series spectrum analyzer, will be demonstrated at IMS 2009. Innovative DPX Density™ triggering enables yet another unique method of isolating frequency domain signals based on statistical occurrence. The swept DPX functionality enables DPX spectrum viewing over the entire range of the spectrum analyzer, to 14 GHz, and the highest probability of detecting spectrum events. With >292,000 spectrum updates per second, the patented DPX technology represents a six-fold improvement on the first generation capability. Also included in Option 200 on the RSA6000 Series spectrum analyzers are the unique time-qualified and runt triggering functionalities that bring complex time-domain oscilloscope triggering functionality to the world best performing spectrum analyzer.

Additional RSA6000 Series Enhancements Include Deeper Modulation Analysis Capabilities

The RSA6000 Series spectrum analyzer with option 21 now includes new modulation analysis and display enhancements for the government communications designer and operators of spectrum management systems. The new modulation types enable development of cutting-edge communications systems necessary to meet the need for increased communications bandwidth and spectrum efficiency in military and homeland security applications. These enhancements are a free software upgrade to existing RSA6000 Series owners.

Driving the Greening of Wireless with Open Loop Active Harmonic Load Pull

Tektronix has teamed with Mesuro Limited to demonstrate the most advanced system for nonlinear measurements that is commercially available. Based on the Tektronix AWG7122B Arbitrary Waveform Generator and DSA8200 Sampling Oscilloscope, the Mesuro MB 20 Open Loop Active Harmonic Load Pull system enables the characterization of devices and power amplifiers for any signal and impedance environment up to 150 W in power. Being an all-electronic solution, it is ideal for on-wafer measurements. These solutions enable customers to design more efficient power devices for the wireless industry and have a demonstrated capability to optimize performance with first-pass designs. The system will be shown in the Tektronix booth #2624 at IMS2009.

Tektronix H600/SA2600 Products Enhanced For Remote Monitoring Applications

Tektronix already offers the industries’ most complete portable spectrum analyzer solution for interference and signal hunting applications, and the new enhancements improve the utility for remote RF monitoring and sensing applications. Users are able to improve spectrum awareness for unattended applications with synchronous triggering and GPS time stamps for RF measurements.

Arbitrary Waveform Generators Simplify S-parameter Measurements

Tektronix is also introducing a new software module for RFXpress (RFX100 option SPARA) that provides emulation of RF components from touchstone files. Engineers can use arbitrary waveform signals and cascade multiple touchstone files to emulate a RF chain gain insight into component behaviour with a complex stimulus and to shorten design time. The effect of the RF component can also be de-embedded by selecting the Inversion option. This option also adds a provision to characterize a two-port device (DUT). A wizard simplifies the process by guiding you through a step-by-step process to obtain S21 characteristics (Insertion loss) of the device in a text format.

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