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Industry News

Agilent Displays Innovations in Design and Test Capabilities

June 9, 2009
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Agilent Technologies Inc. announced that it will demonstrate its newest innovations in design and measurement solutions for advanced RF and microwave research, development and manufacturing at the IEEE MTT-S International Microwave Symposium 2009, Boston Convention & Exhibition Center, Booth 1407, June 7-12.


"Agilent's solutions help engineers accelerate their innovations in wireless devices and networks, such as 3GPP LTE and WiMAX(tm)," said Barry Alcorn, US Marketing Program Manager in Agilent's Electronic Measurement group. "At IMS 2009 we're showing a stellar lineup of new, leading-edge solutions for communication research, design and development processes that will continue this leadership in the latest technologies."

Connecting experts to experts, the popular MicroApps Theater, sponsored by Agilent, will offer 19 MicroApps sessions. Planned topics include front-to-back MMIC design flow including nonlinear parameter extraction, nonlinear network analysis, wideband signal analysis, and simulation and design of software-defined radios. A full list of papers and an online registration form are available at www.agilent.com/find/IMS2009.

Agilent will showcase the following at IEEE MTT-S IMS 2009:

Accurate Nonlinear Device Measurements: The Agilent PNA-X Nonlinear Vector Network Analyzer (NVNA), based on the PNA-X, measures nonlinear device characteristics and gives accurate insight into the nonlinear behavior of active devices using Agilent's NVNA application software and new calibration phase references. Agilent's award-winning PNA-X NVNA includes a 13.5 GHz model and the industry's first 43.5 and 50 GHz NVNA.

Comprehensive Active-Device Test: The Agilent PNA-X Series network analyzers can measure an amplifier's gain, gain compression, harmonics, IMD and noise figure with one easy setup and without an external combiner or filters. A new calibration technique yields the industry's most accurate noise figure measurements. The PNA-X also has complete pulsed and balanced measurement capabilities. It is the world's most flexible network analyzer. The new 43.5 (N5244A) and 50 GHz (N5245A) models support higher frequency applications such as radar and satellite communications, while the 13.5 GHz (N5241A) model is ideal for lower-frequency devices used in wireless communications.

Scanning Microwave Microscopy (SMM): Agilent's Atomic Force Microscope 5420 AFM in conjunction with Agilent's vector network analyzer can be used for high spatial resolution of electromagnetic materials properties. Agilent's unique SMM Mode combines the compound, calibrated electrical measurement capabilities of a microwave vector network analyzer (VNA) with the nanoscale spatial resolution of an atomic force microscope. SMM Mode's ability to provide calibrated, high-sensitivity, complex electrical and spatial measurements is particularly useful for semiconductor test and characterization. In addition to enabling complex impedance (resistance and reactance) measurements, SMM Mode can be used to acquire calibrated capacitance and calibrated dopant density measurements when studying sidewall diffusion.

Integrated ADS with Broad Electromagnetic Analysis: EMPro 2009 is full 3-D electromagnetic (EM) design and simulation software. It contains both finite-element-method and finite-difference-time-domain EM simulation techniques, integrated with Advanced Design System (ADS) to allow design simulation and cross-verification of all types of EM analysis problems without the extra cost, stops and starts associated with leaving the design flow to perform analysis with separate, point tools. The integration speeds the overall design and verification process and gets communications products to the marketplace more quickly.

Complete, Front-to-Back Solution for MMIC, RF Module Design: Advanced Design System 2009 Update 1 is the industry's first complete, front-to-back solution for monolithic microwave integrated circuit (MMIC) and RF module design integrates electromagnetic analysis, wireless standards-based design verification libraries, X-parameter simulation and statistical design and yield optimization. It allows designers to stay within the design and simulation platform of choice for their entire design cycle, eliminating the need for separate, time-consuming point tools.

Microwave Signal Generator that Breaks the One-Watt Output Power Barrier: The Agilent PSG E8257D option 521 signal generator delivers output power in excess of one-watt over most of its frequency range. With specified output power from +24 to +28 dBm over most of its 20 GHz of frequency range, it eliminates the need for additional hardware such as amplifiers, couplers and detectors in most high-power test environments.

Advanced Wideband Vector Signal Analysis and Digital Troubleshooting: Agilent's Infiniium 9000 Series oscilloscopes offer the broadest measurement capability with true analog bandwidths up to 4 GHz. They have impressive scope performance and built-in logic and protocol analysis. These oscilloscopes are the world's first scopes with integrated logic analysis channels and a protocol analyzer viewer for buses such as PCIeTM and USB. These integrated features extend scope functionality, making it easier for engineers to test complex designs, and giving companies higher oscilloscope utilization for better return on capital equipment.

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