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Testbench: May 2009

April 23, 2009
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TestBench
April 2009

Characterizing nonlinear devices involves measurements and modeling to achieve optimum results. For measurements, Non-linear Vector Network Analyzers (NVNA) are traditionally used to address this market. An emerging approach supports simultaneous measurement of actual current and voltage waveforms at the device and engineering of waveform shapes to boost efficiency.

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